Enhanced Dye and Pull Analysis for CSP Package Types. - Sinai Galvan; Daniel J. D. Sullivan (IRPS, 2025)

Failure Analysis of Particle Contamination in Battery. - Yuanqin Liu; Kelly Prochaska; Dogancan Sari; Daniel J. D. Sullivan (IRPS, 2025)

Using Thermal Reflectance Analysis with the Microsanj for Open Defect Localization. - Curtis Jacob Ritter; Dustin Kendig; Sean Duffy; Daniel J. D. Sullivan (IRPS, 2025)