An Unsupervised Learning Approach to Validate the Robustness of Octagonal MOSFETs in X-Ray Environments. - Vinicius Vono Peruzzi; Daniel Marchesi De Camargo Neves; Fernando Rezende Zagatti; Gilson Yuuji Shimizu; Wellington Romeiro De Melo; Luis Eduardo Seixas Jr.; Saulo Finco; Salvador Pinillos Gimenez (IEEE Access, 2026)