Partially Duplicated Code-Disjoint Carry-Skip Adder. - Daniel Marienfeld; Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan (DFT, 2002)

A New Self-Checking Code-Disjoint Carry-Skip Adder. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (IOLTW, 2002)

A Modulo p Checked Self-Checking Carry Select Adder. - Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan; Daniel Marienfeld (IOLTS, 2003)

Self-checking Carry-selectAdder with Sum-bit Duplication. - Egor S. Sogomonyan; Daniel Marienfeld; Vitalij Ocheretnij; Michael Gössel (ARCS Workshops, 2004)

A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. - Egor S. Sogomonyan; Daniel Marienfeld; Vitalij Ocheretnij; Michael Gössel (DATE, 2004)

A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (ETS, 2004)

Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. - Vitalij Ocheretnij; Daniel Marienfeld; Egor S. Sogomonyan; Michael Gössel (IOLTS, 2004)

New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (Asian Test Symposium, 2005)

A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (IOLTS, 2006)

Modulo p=3 Checking for a Carry Select Adder. - Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan; Daniel Marienfeld (J. Electron. Test., 2006)

Effiziente Fehlererkennung für arithmetische Einheiten. - Daniel Marienfeld (2007)

New Self-Checking Booth Multipliers. - Marc Hunger; Daniel Marienfeld (Int. J. Appl. Math. Comput. Sci., 2008)

Array Termination Impacts in Advanced SRAM. - Randy W. Mann; Sandeep Puri; Sheng Xie; Daniel Marienfeld; Joseph Versaggi; Bianzhu Fu; Michael Gribelyuk; Ratheesh R. Thankalekshmi; Xiaoqiang Zhang; Hui Zang; Chad E. Weintraub (IEEE Trans. Very Large Scale Integr. Syst., 2017)