Reliability testing of integrated low-temperature PVD PZT films. - Daniel Monteiro Diniz Reis; Sven Rzepka; Karla Hiller (Microelectron. Reliab., 2018)

Defect-controlled Resistance Degradation of Sputtered Lead Zirconate Titanate Thin Films. - Kuan-Ting Ho; Daniel Monteiro Diniz Reis; Karla Hiller (IRPS, 2022)