Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories. - Saket Gupta; Carl Monzel; Daniel S. Reed; Yifei Zhang; Mark Winter; Myron Buer (IEEE Trans. Circuits Syst. I Regul. Pap., 2016)

Scaling trends and bias dependence of the soft error rate of 16 nm and 7 nm FinFET SRAMs. - Balaji Narasimham; Saket Gupta; Daniel S. Reed; J. K. Wang; Nick Hendrickson; Hasan Taufique (IRPS, 2018)