Extraction of bonding strain data in diode lasers from polarization-resolved photoluminescence measurements. - Mark A. Fritz; Daniel T. Cassidy (Microelectron. Reliab., 2004)

Strain estimation in III-V materials by analysis of the degree of polarization of luminescence. - Daniel T. Cassidy; Chadwick K. Hall; Othman Rehioui; Laurent Béchou (Microelectron. Reliab., 2010)