Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level. - Jean-Luc Autran; Daniela Munteanu; Philippe Roche; Gilles Gasiot; S. Martinie; S. Uznanski; S. Sauze; S. Semikh; Evgeny Yakushev; S. Rozov; Pia Loaiza; G. Warot; et al. (Microelectron. Reliab., 2010)

Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits. - Jean-Luc Autran; Maximilien Glorieux; Daniela Munteanu; Sylvain Clerc; Gilles Gasiot; Philippe Roche (Microelectron. Reliab., 2014)

Real-time soft-error rate measurements: A review. - Jean-Luc Autran; Daniela Munteanu; Philippe Roche; Gilles Gasiot (Microelectron. Reliab., 2014)

Radiation sensitivity of junctionless double-gate 6T SRAM cells investigated by 3-D numerical simulation. - Daniela Munteanu; Jean-Luc Autran (Microelectron. Reliab., 2014)

Radiation and COTS at ground level. - Jean-Luc Autran; Daniela Munteanu (Microelectron. Reliab., 2015)

ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure. - Jean-Luc Autran; Daniela Munteanu; Soilihi Moindjie; Tarek Saad Saoud; S. Sauze; Gilles Gasiot; Philippe Roche (Microelectron. Reliab., 2015)

SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation. - Daniela Munteanu; Jean-Luc Autran (Microelectron. Reliab., 2015)

3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs. - Daniela Munteanu; Jean-Luc Autran (Microelectron. Reliab., 2015)

Natural radiation events in CCD imagers at ground level. - Tarek Saad Saoud; Soilihi Moindjie; Daniela Munteanu; Jean-Luc Autran (Microelectron. Reliab., 2016)

Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs. - Soilihi Moindjie; Jean-Luc Autran; Daniela Munteanu; Gilles Gasiot; Philippe Roche (Microelectron. Reliab., 2017)

Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation. - Daniela Munteanu; Jean-Luc Autran; Soilihi Moindjie (Microelectron. Reliab., 2017)