Semisupervised Classification of Anomalies Signatures in Electrical Wafer Sorting (EWS) Maps. - Luigi Claudio Viagrande; Filippo L. M. Milotta; Paola Giuffrè; Giuseppe Bruno; Daniele Vinciguerra; Giovanni Gallo (VISIGRAPP (5: VISAPP), 2020)

Comparing dispatching rules for minimizing the total weighted tardiness in the cleaning-diffusion manufacturing stage. - Roberto Rosario Corsini; Antonio Costa 001; Giuseppe Oriti; Sergio Fichera; Daniele Vinciguerra; Marco Stefano Scroppo; Daniele Pagano (CASE, 2024)