Flash-based Field Programmable Gate Array Technology with Deep Trench Isolation. - Kyung Joon Han; Nigel Chan; Sungrae Kim; Ben Leung; Volker Hecht; Brian Cronquist; Danny Shum; Armin Tilke; Laura Pescini; Martin Stiftinger; Ronald Kakoschke (CICC, 2007)

Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device. - Laiqiang Luo; Kalya Shubhakar; Sen Mei; Nagarajan Raghavan; Fan Zhang; Danny Shum; Kin Leong Pey (IRPS, 2020)