Refined electrical analysis of two charge states transition characteristic of "borderless" silicon nitride. - Gaelle Beylier; Sylvie Bruyère; Darcy Benoit; Gérard Ghibaudo (Microelectron. Reliab., 2007)

Impact of silicon nitride CESL on NLDEMOS transistor reliability. - Gaelle Beylier; Sylvie Bruyère; Darcy Benoit; Gérard Ghibaudo (Microelectron. Reliab., 2008)