Universal Test Controller Chip for Board Self Test. - Andrzej Hlawiczka; Dariusz Badura (Fehlertolerierende Rechensysteme, 1987)

Efficiency of Self-Test Path as a Test Pattern Generator and Test Response Compactor. - Dariusz Badura (Fehlertolerierende Rechensysteme, 1989)

Low Cost Bist for Edac Circuits. - Dariusz Badura; Andrzej Hlawiczka (Asian Test Symposium, 1997)

Prediction of Urban Traffic Flow Based on Generative Neural Network Model. - Dariusz Badura (TST, 2018)

Activities Classification Based on IMU Signals. - Monika N. Bugdol; Marta Danch-Wierzchowska; Marcin D. Bugdol; Dariusz Badura (ITIB, 2022)

Comparative Analysis of Selected Methods of Identifying the Newborn's Skeletal Model. - Adam Mrózek; Marta Danch-Wierzchowska; Daniel Ledwon; Dariusz Badura; Iwona Doroniewicz; Monika N. Bugdol; Malgorzata Matyja; Andrzej Mysliwiec (ITIB, 2022)