Enabling LOS delay test with slow scan enable. - Satyadev Ahlawat; Darshit Vaghani; Rohini Gulve; Virendra Singh (EWDTS, 2016)

On Securing Scan Design from Scan-Based Side-Channel Attacks. - Satyadev Ahlawat; Darshit Vaghani; Jaynarayan T. Tudu; Virendra Singh (ATS, 2017)

Preventing scan-based side-channel attacks through key masking. - Satyadev Ahlawat; Darshit Vaghani; Virendra Singh (DFT, 2017)

An efficient test technique to prevent scan-based side-channel attacks. - Satyadev Ahlawat; Darshit Vaghani; Virendra Singh (ETS, 2017)

A low cost technique for scan chain diagnosis. - Satyadev Ahlawat; Darshit Vaghani; Rohini Gulve; Virendra Singh (ISCAS, 2017)

A Cost Effective Technique for Diagnosis of Scan Chain Faults. - Satyadev Ahlawat; Darshit Vaghani; Jaynarayan T. Tudu; Ashok Suhag (VDAT, 2017)

Using MISR as Countermeasure Against Scan-Based Side-Channel Attacks. - Satyadev Ahlawat; Darshit Vaghani; Naveen Bazard; Virendra Singh (EWDTS, 2018)

On Securing Scan Design Through Test Vector Encryption. - Darshit Vaghani; Satyadev Ahlawat; Jaynarayan T. Tudu; Masahiro Fujita; Virendra Singh (ISCAS, 2018)