Modeling and simulation of transistor and circuit variability and reliability. - Asen Asenov; Binjie Cheng; Daryoosh Dideban; Urban Kovac; Negin Moezi; Campbell Millar; Gareth Roy; Andrew R. Brown; Scott Roy (CICC, 2010)

Capturing intrinsic parameter fluctuations using the PSP compact model. - Binjie Cheng; Daryoosh Dideban; Negin Moezi; Campbell Millar; Gareth Roy; Xingsheng Wang; Scott Roy; Asen Asenov (DATE, 2010)

Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP. - Binjie Cheng; Daryoosh Dideban; Negin Moezi; Campbell Millar; Gareth Roy; Xingsheng Wang; Scott Roy; Asen Asenov (IEEE Des. Test Comput., 2010)

Impact of statistical parameter set selection on the statistical compact model accuracy: BSIM4 and PSP case study. - Negin Moezi; Daryoosh Dideban; Binjie Cheng; Scott Roy; Asen Asenov (Microelectron. J., 2013)

Statistical Strategies to Reproduce the Propagation Delay Time Variability Using Compact Models. - Hamed Jooypa; Daryoosh Dideban (IEEE Trans. Circuits Syst. II Express Briefs, 2019)

Statistical Strategies to Capture Correlation Between Overshooting Effect and Propagation Delay Time in Nano-CMOS Inverters. - Hamed Jooypa; Daryoosh Dideban; Hadi Heidari (IEEE Access, 2021)