An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time. - Takahiro J. Yamaguchi; H. X. Hou; Koji Takayama; Dave Armstrong; Masahiro Ishida; Mani Soma (ITC, 2007)

Known-good-die test methods for large, thin, high-power digital devices. - Dave Armstrong; Gary Maier (ITC, 2016)

Special Session: Test Challenges in a Chiplet Marketplace. - Marc Hutner; R. Sethuram; Bapi Vinnakota; Dave Armstrong; A. Copperhall (VTS, 2020)