Hot carrier effects on the RF performance degradation of nanoscale LNA SOI nFETs. - Dimitris P. Ioannou; Y. Tan; R. Logan; K. Bandy; R. Achanta; P. C. Wang; Dave Brochu; M. Jaffe (IRPS, 2018)

Physics of Hot Carrier Degradation Under Saturation Mode Operation in SiGe HBTs. - Uppili S. Raghunathan; Pui Yee; Dave Brochu; Vibhor Jain; Harrison P. Lee; John D. Cressler; Dimitris P. Ioannou (BCICTS, 2020)

Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs. - Dimitris P. Ioannou; Uppili S. Raghunathan; Dave Brochu; Adam W. DiVergilio; Vibhor Jain; John J. Pekarik (BCICTS, 2021)

Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. - M. Hauser; P. Srinivasan 002; A. Vallett; R. Krishnasamy; Fernando Guarin; Dave Brochu; V. Pham; Byoung Min (IRPS, 2022)