The impact of analog computational error on an analog boolean satisfiability solver. - David A. Basford; Jared M. Smith; R. Joseph Connor; Bruce J. MacLennan; Jeremy Holleman (ISCAS, 2016)

A Sub-1V-Read Flash Memory in a Standard 130nm CMOS Process. - David A. Basford; Mohsen Judy; Peixing Liu; Jeremy Holleman (ISCAS, 2018)