Titanium dioxide (TiO2)-based gate insulators. - Stephen A. Campbell; Hyeon-Seag Kim; David C. Gilmer; Boyong He; Tiezhong Ma; Wayne L. Gladfelter (IBM J. Res. Dev., 1999)

Emerging CMOS and beyond CMOS technologies for an ultra-low power 3D world. - Chang Yong Kang; K. W. Ang; R. Hill; W. Y. Loh; Jungwoo Oh; Rinus Lee; David Gilmer; Gennadi Bersuker; C. Hobbs; Paul Kirsch; Klaus Hummler; S. Arkalgud; et al. (ICICDT, 2012)

Connecting RRAM performance to the properties of the hafnia-based dielectrics. - Gennadi Bersuker; Brian Butcher; David Gilmer; Paul Kirsch; Luca Larcher; Andrea Padovani (ESSDERC, 2013)

Analytical modelling and leakage optimization in complementary resistive switch (CRS) crossbar arrays. - Stefano Ambrogio; Simone Balatti; Daniele Ielmini; David C. Gilmer (ESSDERC, 2014)

NRAM status and prospects. - David C. Gilmer; Thomas Rueckes; Lee Cleveland; Darlene Viviani (ICICDT, 2017)

Memory update characteristics of carbon nanotube memristors (NRAM®) under circuitry-relevant operation conditions. - Dmitry Veksler; Gennadi Bersuker; Adam W. Bushmaker; Maribeth Mason; P. R. Shrestha; Kin P. Cheung; Jason P. Campbell; Thomas Rueckes; Lee Cleveland; Harry Luan; David C. Gilmer (IRPS, 2020)