Ion microbeam probing of sense amplifiers to analyze single event upsets in a CMOS DRAM. - Linda M. Geppert; Urs Bapst; David F. Heidel; Keith A. Jenkins (IEEE J. Solid State Circuits, 1991)

Design and implementation of high performance dynamic 64-bit parallel adder with enhanced testability. - Wei Hwang; George Diedrich Gristede; Pia N. Sanda; Shao Y. Wang; David F. Heidel (CICC, 1998)

High-Speed Serializing/De-Serializing Design-For-Test Method for Evaluating a 1 GHz Microprocessor. - David F. Heidel; Sang H. Dhong; H. Peter Hofstee; Michael Immediato; Kevin J. Nowka; Joel Silberman; Kevin Stawiasz (VTS, 1998)

Designing a Testable System on a Chip. - Stephen V. Kosonocky; Arthur A. Bright; Kevin W. Warren; Ruud A. Haring; Steve Klepner; Sameh W. Asaad; S. Basavaiah; Bob Havreluk; David F. Heidel; Michael Immediato; Keith A. Jenkins; Rajiv V. Joshi; et al. (VTS, 1998)

A 1.0-GHz single-issue 64-bit powerPC integer processor. - Joel Silberman; Naoaki Aoki; David Boerstler; Jeffrey L. Burns; Sang H. Dhong; Axel Essbaum; Uttam Ghoshal; David F. Heidel; H. Peter Hofstee; Kyung T. Lee; David Meltzer; Hung C. Ngo; et al. (IEEE J. Solid State Circuits, 1998)

Implementation of a self-resetting CMOS 64-bit parallel adder with enhanced testability. - Wei Hwang; George Diedrich Gristede; Pia N. Sanda; Shao Y. Wang; David F. Heidel (IEEE J. Solid State Circuits, 1999)

Blue Gene/L, a System-On-A-Chip. - George S. Almási; Daniel K. Beece; Ralph Bellofatto; Gyan Bhanot; Randy Bickford; Matthias A. Blumrich; Arthur A. Bright; José R. Brunheroto; Calin Cascaval; José G. Castaños; Luis Ceze; Paul Coteus; et al. (CLUSTER, 2002)

An overview of the BlueGene/L Supercomputer. - Narasimha R. Adiga; George Almási 001; George S. Almási; Yariv Aridor; Rajkishore Barik; Daniel K. Beece; Ralph Bellofatto; Gyan Bhanot; Randy Bickford; Matthias A. Blumrich; Arthur A. Bright; José R. Brunheroto; et al. (SC, 2002)

Minimizing inductive noise in system-on-a-chip with multiple power gating structures. - Suhwan Kim 001; Stephen V. Kosonocky; Daniel R. Knebel; Kevin Stawiasz; David F. Heidel; Michael Immediato (ESSCIRC, 2003)

An on-chip jitter measurement circuit with sub-picosecond resolution. - Keith A. Jenkins; Anup P. Jose; David F. Heidel (ESSCIRC, 2005)

Single-Event-Upset Trends in Advanced CMOS Technologies. - David F. Heidel (DFT, 2006)

A pulsed low-voltage swing latch for reduced power dissipation in high-frequency microprocessors. - Pong-Fei Lu; Nianzheng Cao; Leon J. Sigal; Pieter Woltgens; Raphael Robertazzi; David F. Heidel (ISLPED, 2006)

Single-event-upset and alpha-particle emission rate measurement techniques. - Michael S. Gordon; Kenneth P. Rodbell; David F. Heidel; Cyril Cabral Jr.; Ethan H. Cannon; Daniel D. Reinhardt (IBM J. Res. Dev., 2008)

Preface. - David F. Heidel; Jack Hergenrother; Kenneth P. Rodbell (IBM J. Res. Dev., 2008)

Alpha-particle-induced upsets in advanced CMOS circuits and technology. - David F. Heidel; Kenneth P. Rodbell; Ethan H. Cannon; Cyril Cabral Jr.; Michael S. Gordon; Phil Oldiges; Henry H. K. Tang (IBM J. Res. Dev., 2008)

New simulation methodology for effects of radiation in semiconductor chip structures. - Henry H. K. Tang; Conal E. Murray; Giovanni Fiorenza; Kenneth P. Rodbell; Michael S. Gordon; David F. Heidel (IBM J. Res. Dev., 2008)