A Tester-Independent Automated Test Preparation Process for Loaded Boards. - Hookuong Wong; David Florcik (ITC, 1982)

Simulation Pattern Capturing System for Design Verification Using a Dynamic High Speed Functional Tester (DHSFT). - David Florcik; David Low (ITC, 1983)

Prototype Debug using ATE. - David Florcik; David Low; Martin Roche (IEEE Des. Test, 1984)