Integrated Functional/Structural Timing for Digital Simulation. - David Giles; Charles Berking; Kenneth Wacks (ITC, 1982)

Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. - Herold Levine; Charles Berking; Alan Blair; Kenneth R. Bowden; Peter deBruyn Kops; David Giles; David Ruhoff; Kenneth Wacks (ITC, 1982)

Device Models : A New Methodology for a Perennial Problem. - David Giles; Gregory A. Maston (ITC, 1984)

Maintaining Simulation Accuracy through Physical Device Models. - David Giles; Kenneth R. Bowden; Mike Haney; Gregory A. Maston (ITC, 1985)

Influence of Artefact Correction and Recording Device Type on the Practical Application of a Non-Linear Heart Rate Variability Biomarker for Aerobic Threshold Determination. - Bruce Rogers; David Giles; Nick Draper; Laurent Mourot; Thomas Gronwald (Sensors, 2021)