Time and cost constrained optimal designs of constant-stress and step-stress accelerated life tests. - David Han 001 (Reliab. Eng. Syst. Saf., 2015)

Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Distribution Under Type-I Censoring. - David Han 001; Debasis Kundu (IEEE Trans. Reliab., 2015)

Optimal design of a simple step-stress accelerated life test under progressive type I censoring with nonuniform durations for exponential lifetimes. - David Han 001 (Qual. Reliab. Eng. Int., 2019)

Design optimization of a simple step-stress accelerated life test - Contrast between continuous and interval inspections with non-uniform step durations. - David Han 001; Tianyu Bai (Reliab. Eng. Syst. Saf., 2020)

On the Existence of the Optimal Step-Stress Accelerated Life Tests Under Progressive Type-I Censoring. - David Han 001 (IEEE Trans. Reliab., 2020)

Parameter Estimation Using EM Algorithm For Lifetimes From Step-Stress and Constant-Stress Accelerated Life Tests With Interval Monitoring. - David Han 001; Tianyu Bai (IEEE Trans. Reliab., 2021)

Optimal planning of progressively Type-I censored step-stress accelerated life test under interval inspection. - David Han 001; Tianyu Bai (Commun. Stat. Simul. Comput., 2022)

Big Data Analytics, Data Science, ML&AI for Connected, Data-driven Precision Agriculture and Smart Farming Systems: Challenges and Future Directions. - David Han 001 (CPS-IoT Week Workshops, 2023)

Bayesian estimation of the mean time between failures of subsystems with different causes using interval-censored system maintenance data. - David Han 001; James D. Brownlow; Jesse Thompson; Ralph G. Brooks (Qual. Reliab. Eng. Int., 2024)

Negative Nudging to Quantify the LLM Hallucination. - David Han 001; Adrienne Raglin; Doug Summers-Stay (HCI (56), 2025)

Exact inference for progressively Type-I censored step-stress accelerated life test under interval monitoring. - David Han 001; Tianyu Bai (Comput. Stat., 2025)