Improved IDDQ Testing with Empirical Linear Prediction. - David I. Bergman; Hans Engler (ITC, 2002)

A low-noise latching comparator probe for waveform sampling applications. - David I. Bergman; Bryan C. Waltrip (IEEE Trans. Instrum. Meas., 2003)

Low thermal error sampling comparator for accurate settling measurements. - David I. Bergman; Bryan C. Waltrip (ISCAS (1), 2004)

Dynamic error correction of a digitizer for time-domain metrology. - David I. Bergman (IEEE Trans. Instrum. Meas., 2004)

Pulse parameter dependence on transition occurrence instant and waveform epoch. - Donald R. Larson; Nicholas G. Paulter Jr.; David I. Bergman (IEEE Trans. Instrum. Meas., 2005)

Phase-plane-derived distortion modeling of a fast and accurate digitizing sampler. - David I. Bergman; Gerard N. Stenbakken (IEEE Trans. Instrum. Meas., 2006)