The HITEST Test Generation System Overview. - David J. Wharton (ITC, 1983)

High performance test generation for accurate defect models in CMOS gate array technology. - Hector R. Sucar; Susheel J. Chandra; David J. Wharton (ICCAD, 1989)

CrossCheck: A Practical Solution for ASIC Testability. - George Swan; Yatin Trivedi; David J. Wharton (ITC, 1989)