On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP). - Martin Sauter; Werner Simbürger; David Johnsson; Matthias Stecher (Microelectron. Reliab., 2011)

HMM-TLP correlation for system-efficient ESD design. - Guido Notermans; Sergey Bychikhin; Dionyz Pogany; David Johnsson; Dejan M. Maksimovic (Microelectron. Reliab., 2012)