How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002. - Yogendra Joshi; Kaveh Azar; David L. Blackburn; Clemens J. M. Lasance; Ravi Mahajan; Jukka Rantala (Microelectron. J., 2003)

Modeling and simulation of resistivity of nanometer scale copper. - A. Emre Yarimbiyik; Harry A. Schafft; Richard A. Allen; Mona E. Zaghloul; David L. Blackburn (Microelectron. Reliab., 2006)