Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. - Ramakrishna Voorakaranam; Randy Newby; Sasikumar Cherubal; Bob Cometta; Thomas Kuehl; David M. Majernik; Abhijit Chatterjee (ITC, 2003)

Concurrent RF Test Using Optimized Modulated RF Stimuli. - Sasikumar Cherubal; Ramakrishna Voorakaranam; Abhijit Chatterjee; John McLaughlin; Jason L. Smith; David M. Majernik (VLSI Design, 2004)