Face Recognition Using Landmark-Based Bidimensional Regression. - Jiazheng Shi; Ashok Samal; David Marx (ICDM, 2005)

How effective are landmarks and their geometry for face recognition? - Jiazheng Shi; Ashok Samal; David Marx (Comput. Vis. Image Underst., 2006)

Spatial Clustering Using the Likelihood Function. - April Kerby; David Marx; Ashok Samal; Viacheslav Adamchuck (ICDM Workshops, 2007)

Analysis of sexual dimorphism in human face. - Ashok Samal; Vanitha Subramani; David Marx (J. Vis. Commun. Image Represent., 2007)

Computation of a face attractiveness index based on neoclassical canons, symmetry, and golden ratios. - Kendra Schmid; David Marx; Ashok Samal (Pattern Recognit., 2008)

Wafer Thickness Sensor (WTS) for etch depth measurement of TSV. - David Marx; David Grant; Russ Dudley; Andy Rudack; W. H. Teh (3DIC, 2009)

A route towards production-worthy 5 µm × 25 µm and 1 µm × 20 µm non-Bosch through-silicon-via (TSV) etch, TSV metrology, and TSV integration. - Weng Hong Teh; Raymond Caramto; Jamal Qureshi; Sitaram Arkalgud; M. O'Brien; T. Gilday; Kou Maekawa; T. Saito; Kouichi Maruyama; Thenappan Chidambaram; Wei Wang 003; David Marx; et al. (3DIC, 2009)

Searching satellite imagery with integrated measures. - Ashok Samal; Sanjiv K. Bhatia; Prasanth Vadlamani; David Marx (Pattern Recognit., 2009)

Using bidimensional regression to assess face similarity. - Sarvani Kare; Ashok Samal; David Marx (Mach. Vis. Appl., 2010)

Quantifying Articulatory Distinctiveness of Vowels. - Jun Wang 037; Jordan R. Green; Ashok Samal; David Marx (INTERSPEECH, 2011)

Evaluation of non-destructive etch depth measurement for through silicon vias. - Thuy Dao; Tania Thomas; David Marx; David Grant (ICICDT, 2012)

Evaluation of particle motions in stabilized specimens of transparent sand using deep learning segmentation. - David Marx; Krishna Kumar; Jorge Zornberg (CoRR, 2022)