An Overview of CMOS VLSI Failure Analysis and the Importance of Test and Diagnostics. - David P. Vallett (ITC, 1996)

IC Failure Analysis: The Importance of Test and Diagnostics. - David P. Vallett (IEEE Des. Test Comput., 1997)

Diagnosis and characterization of timing-related defects by time-dependent light emission. - Daniel R. Knebel; Pia N. Sanda; Moyra K. McManus; Jeffrey A. Kash; James C. Tsang; David P. Vallett; Leendert M. Huisman; Phil Nigh; Rick Rizzolo; Peilin Song; Franco Motika (ITC, 1998)

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. - Phil Nigh; David P. Vallett; Atul Patel; Jason Wright (ITC, 1998)

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. - Phil Nigh; David P. Vallett; Atul Patel; Jason Wright; Franco Motika; Donato O. Forlenza; Ray Kurtulik; Wendy Chong (ITC, 1999)

Picosecond imaging circuit analysis. - James C. Tsang; Jeffrey A. Kash; David P. Vallett (IBM J. Res. Dev., 2000)

Time-resolved optical characterization of electrical activity in integrated circuits. - James C. Tsang; Jeffrey A. Kash; David P. Vallett (Proc. IEEE, 2000)