Focused high- and low-energy ion milling for TEM specimen preparation. - Andriy Lotnyk; D. Poppitz; U. Ross; J. W. Gerlach; Frank Frost; S. Bernütz; E. Thelander; B. Rauschenbach (Microelectron. Reliab., 2015)

Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. - Mikael Broas; Andreas Graff; Michél Simon-Najasek; David Poppitz; Frank Altmann; Helmut Jung; Hervé Blanck (Microelectron. Reliab., 2016)

Exploring the thermal limit of GaN power devices under extreme overload conditions. - Florian Peter Pribahsnik; Michael Nelhiebel; M. Mataln; Mirko Bernardoni; G. Prechtl; Frank Altmann; David Poppitz; A. Lindemann (Microelectron. Reliab., 2017)

Physical failure analysis methods for wide band gap semiconductor devices. - Andreas Graff; Michél Simon-Najasek; David Poppitz; Frank Altmann (IRPS, 2018)

Cathodoluminescence spectroscopy for failure analysis and process development of GaN-based microelectronic devices. - C. Monachon; Marcin Stefan Zielinski; J. Berney; D. Poppitz; Andreas Graff; Steffen Breuer; Lutz Kirste (IRPS, 2018)

Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling. - Enrico Zanoni; Matteo Meneghini; Gaudenzio Meneghesso; Fabiana Rampazzo; Daniele Marcon; Veronica Gao Zhan; Francesca Chiocchetta; Andreas Graff; Frank Altmann; Michél Simon-Najasek; David Poppitz (IRPS, 2020)