Testability access of the high speed test features in the Alpha 21264 microprocessor. - Dilip K. Bhavsar; David R. Akeson; Michael K. Gowan; Daniel B. Jackson (ITC, 1998)

A highly testable and diagnosable fabrication process test chip. - Dilip K. Bhavsar; Ugonna Echeruo; David R. Akeson; William J. Bowhill (ITC, 1998)