Critical Path Tracing: An Alternative to Fault Simulation. - Miron Abramovici; Prem R. Menon; David T. Miller (IEEE Des. Test, 1984)

Test Generation In Lamp2: System Overview. - Miron Abramovici; James J. Kulikowski; Premachandran R. Menon; David T. Miller (ITC, 1985)

Test Generation In Lamp2: Concepts and Algorithms. - Miron Abramovici; James J. Kulikowski; Premachandran R. Menon; David T. Miller (ITC, 1985)

SMART and FAST: Test Generation for VLSI Scan-Design Circuits. - Miron Abramovici; James J. Kulikowski; Premachandran R. Menon; David T. Miller (IEEE Des. Test, 1986)

Checkpoint Faults are not Sufficient Target Faults for Test Generation. - Miron Abramovici; Prem R. Menon; David T. Miller (IEEE Trans. Computers, 1986)

System-level design verification in the AT&T computer division: overview and strategy. - Miron Abramovici; J. W. Bierbauer; R. H. Hellman; C. L. Hong; David T. Miller; R. G. Taylor (ICCD, 1989)

System-level design verification in the AT&T Computer Division: tools. - Miron Abramovici; James J. Kulikowski; David T. Miller; Prem R. Menon (ICCD, 1989)

Global cost functions for test generation. - Miron Abramovici; David T. Miller; R. Henning (ITC, 1990)

Freeze!: A New Approach for Testing Sequential Circuits. - Miron Abramovici; Krishna B. Rajan; David T. Miller (DAC, 1992)

Dynamic redundancy identification in automatic test generation. - Miron Abramovici; David T. Miller; Rabindra K. Roy (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)