Can Defect-Tolerant Chips Better Meet the Quality Challenge? - R. L. Campbell; P. Kuekes; David Y. Lepejian; Wojciech P. Maly; Michael Nicolaidis; Alex Orailoglu (VTS, 1996)

A D&T Roundtable: Testing Mixed Logic and DRAM Chips. - Meh-Ron Amerian; William D. Atwell Jr.; Ian Burgess; Gary D. Fleeman; David Y. Lepejian; T. W. Williams; Farzad Zarrinfar; Yervant Zorian (IEEE Des. Test Comput., 1998)

Tutorial Statement. - Yervant Zorian; Michael Nicolaidis; Peter Muhmenthaler; David Y. Lepejian; Chris W. H. Strolenberg; Kees Veelenturf (DATE, 2000)

Designing and Implementing Efficient BISR Techniques for Embedded RAMs. - Michael Nicolaidis; Slimane Boutobza; Nadir Achouri; R. D. Shawn Blanton; Julie Segal; David Y. Lepejian; Ben Chu; Tony Singh; Harvey Berman (LATW, 2001)

Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. - Julie Segal; Alvin Jee; David Y. Lepejian; Ben Chu (IEEE Des. Test Comput., 2001)