A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis. - Davide Appello; Fulvio Corno; M. Giovinetto; Maurizio Rebaudengo; Matteo Sonza Reorda (Asian Test Symposium, 2001)

The Yield of Test Outsourcing. - Davide Appello (ITC, 2002)

High Accuracy Stimulus Generation for A/D Converter BIST. - Aubin Roy; Stephen K. Sunter; Alessandra Fudoli; Davide Appello (ITC, 2002)

A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. - Davide Appello; Alessandra Fudoli; Vincenzo Tancorre; Fulvio Corno; Maurizio Rebaudengo; Matteo Sonza Reorda (MTDT, 2002)

A practical evaluation of IDDQ test strategies for deep submicron production test application. Experiences and targets from the field. - Alessandra Fudoli; Alberto Ascagni; Davide Appello; Hans A. R. Manhaeve (ETW, 2003)

Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. - Davide Appello; Paolo Bernardi; Alessandra Fudoli; Maurizio Rebaudengo; Matteo Sonza Reorda; Vincenzo Tancorre; Massimo Violante (ITC, 2003)

Yield Analysis of Logic Circuits. - Davide Appello; Alessandra Fudoli; Katia Giarda; Emil Gizdarski; Ben Mathew; Vincenzo Tancorre (VTS, 2004)

Understanding Yield Losses in Logic Circuits. - Davide Appello; Alessandra Fudoli; Katia Giarda; Vincenzo Tancorre; Emil Gizdarski; Ben Mathew (IEEE Des. Test Comput., 2004)

A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. - Davide Appello; Alessandra Fudoli; Vincenzo Tancorre; Paolo Bernardi; Fulvio Corno; Maurizio Rebaudengo; Matteo Sonza Reorda (J. Electron. Test., 2004)

Embedded Memory Diagnosis: An Industrial Workflow. - Davide Appello; Vincenzo Tancorre; Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (ITC, 2006)

Session Abstract. - Davide Appello (VTS, 2006)

On the Automation of the Test Flow of Complex SoCs. - Davide Appello; Vincenzo Tancorre; Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (VTS, 2006)

System-in-Package Testing: Problems and Solutions. - Davide Appello; Paolo Bernardi; Michelangelo Grosso; Matteo Sonza Reorda (IEEE Des. Test Comput., 2006)

An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. - Jorge Luis Lagos-Benites; Davide Appello; Paolo Bernardi; Michelangelo Grosso; Danilo Ravotto; Edgar E. Sánchez; Matteo Sonza Reorda (DFT, 2007)

Automotive IC's: less testing, more prevention. - Davide Appello (ITC, 2007)

An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. - Davide Appello; Paolo Bernardi; R. Cagliesi; M. Giancarlini; Michelangelo Grosso (ETS, 2008)

Robust Design-for-Productization Practices for High Quality Automotive Products. - Paolo Bernardi; Fabio Melchiori; Davide Pandini; Santo Pugliese; Davide Appello (ITC, 2008)

Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. - Davide Appello; Paolo Bernardi; R. Cagliesi; M. Giancarlini; Michelangelo Grosso; Edgar E. Sánchez; Matteo Sonza Reorda (ETS, 2009)

An I-IP based approach for the monitoring of NBTI effects in SoCs. - C. Guardiani; A. Shibkov; Angelo Brambilla; Giancarlo Storti Gajani; Davide Appello; Fausto Piazza; Paolo Bernardi (IOLTS, 2009)

Evaluating Alpha-induced soft errors in embedded microprocessors. - Paolo Rech; Simone Gerardin; Alessandro Paccagnella; Paolo Bernardi; Michelangelo Grosso; Matteo Sonza Reorda; Davide Appello (IOLTS, 2009)

DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. - Davide Appello; Paolo Bernardi; Simone Gerardin; Michelangelo Grosso; Alessandro Paccagnella; Paolo Rech; Matteo Sonza Reorda (VTS, 2009)

Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs. - Davide Appello; Paolo Bernardi; Michelangelo Grosso; Ernesto Sánchez 001; Matteo Sonza Reorda (IEEE Trans. Very Large Scale Integr. Syst., 2009)

Adapting to adaptive testing. - Erik Jan Marinissen; Adit D. Singh; Dan Glotter; Marco Esposito; John M. Carulli Jr.; Amit Nahar; Kenneth M. Butler; Davide Appello; Chris Portelli (DATE, 2010)

Safety features of SoCs: How can they be re-used? - Davide Appello (DDECS, 2010)

Cumulative embedded memory failure bitmap display & analysis. - Nicola Campanelli; Tamas Kerekes; Paolo Bernardi; Mauricio de Carvalho; Alessandro Panariti; Matteo Sonza Reorda; Davide Appello; Mario Barone (DDECS, 2010)

Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. - Paolo Rech; Michelangelo Grosso; Fabio Melchiori; Domenico Loparco; Davide Appello; Luigi Dilillo; Alessandro Paccagnella; Matteo Sonza Reorda (IOLTS, 2010)

Optimized embedded memory diagnosis. - Mauricio de Carvalho; Paolo Bernardi; Matteo Sonza Reorda; Nicola Campanelli; Tamas Kerekes; Davide Appello; Mario Barone; Vincenzo Tancorre; Marco Terzi (DDECS, 2011)

Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? - Said Hamdioui; Davide Appello; Arnaud Grasset; Xinli Gu; Bram Kruseman; Riccardo Mariani; Hermann Obermeir; Srikanth Venkataraman (ETS, 2013)

Current testing: Dead or alive? - Hans A. R. Manhaeve; Pete Harrod; Adit D. Singh; Chintan Patel; Ralf Arnolc; Davide Appello (ETS, 2013)

A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. - Davide Appello; Paolo Bernardi; G. Giacopelli; Alessandro Motta; Alberto Pagani; Giorgio Pollaccia; C. Rabbi; Marco Restifo; P. Ruberg; Ernesto Sánchez 001; C. M. Villa; Federico Venini (DATE, 2017)

A mathematical model to assess the influence of parallelism in a semiconductor back-end test floor. - Davide Appello; M. Laurino; Marco Pranzo (ITC-Asia, 2017)

A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. - Paolo Bernardi; Riccardo Cantoro; L. Gianotto; Marco Restifo; Ernesto Sánchez 001; Federico Venini; Davide Appello (LATS, 2017)

An Optimized Test During Burn-In for Automotive SoC. - Davide Appello; Conrad Bugeja; Giorgio Pollaccia; Paolo Bernardi; Riccardo Cantoro; Marco Restifo; Ernesto Sánchez 001; Federico Venini (IEEE Des. Test, 2018)

Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. - Davide Appello; Paolo Bernardi; Conrad Bugeja; Riccardo Cantoro; Giorgio Pollaccia; Marco Restifo; Federico Venini (J. Electron. Test., 2018)

An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. - Davide Appello; Paolo Bernardi; Conrad Bugeja; Riccardo Cantoro; Andrea Colazzo; Alessandro Motta; Alberto Pagani; Giorgio Pollaccia; Marco Restifo; Ernesto Sánchez 001; Federico Venini (J. Low Power Electron., 2018)

Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. - F. Almeida; Paolo Bernardi; D. Calabrese; Marco Restifo; Matteo Sonza Reorda; Davide Appello; Giorgio Pollaccia; Vincenzo Tancorre; Roberto Ugioli; Gulio Zoppi (DDECS, 2019)

Applicative System Level Test introduction to Increase Confidence on Screening Quality. - Paolo Bernardi; Marco Restifo; Matteo Sonza Reorda; Davide Appello; Claudia Bertani; D. Petrali (DDECS, 2020)

Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. - Davide Appello; Paolo Bernardi; Andrea Calabrese; Stefano Littardi; Giorgio Pollaccia; Stefano Quer; Vincenzo Tancorre; Roberto Ugioli (DDECS, 2021)

Innovative methods for Burn-In related Stress Metrics Computation. - Walter Ruggeri; Paolo Bernardi; Stefano Littardi; Matteo Sonza Reorda; Davide Appello; Claudia Bertani; Giorgio Pollaccia; Vincenzo Tancorre; Roberto Ugioli (DTIS, 2021)

System-Level Test: State of the Art and Challenges. - Davide Appello; H. H. Chen; Matthias Sauer 002; Ilia Polian; Paolo Bernardi; Matteo Sonza Reorda (IOLTS, 2021)

Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. - Francesco Angione; Paolo Bernardi; Gabriele Filipponi; Claudia Tempesta; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (DFT, 2022)

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. - Francesco Angione; Davide Appello; J. Aribido; Jyotika Athavale; Nicolò Bellarmino; Paolo Bernardi; Riccardo Cantoro; Corrado De Sio; Tommaso Foscale; Gabriele Gavarini; J. Guerrero; Martin Huch; et al. (ETS, 2022)

An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. - Francesco Angione; Paolo Bernardi; Gabriele Filipponi; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ETS, 2022)

A novel SEU injection setup for Automotive SoC. - Giusy Iaria; Tommaso Foscale; Paolo Bernardi; Luca Presicce; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ISIE, 2022)

An innovative Strategy to Quickly Grade Functional Test Programs. - Francesco Angione; Paolo Bernardi; Andrea Calabrese; Lorenzo Cardone; A. Niccoletti; Davide Piumatti; Stefano Quer; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ITC, 2022)

In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. - Gabriele Filipponi; Giusy Iaria; Matteo Sonza Reorda; Davide Appello; Giuseppe Garozzo; Vincenzo Tancorre (ITC, 2022)

A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. - Giusy Iaria; Francesco Angione; Paolo Bernardi; Matteo Sonza Reorda; Davide Appello; Giuseppe Garozzo; Vincenzo Tancorre (LATS, 2022)

Parallel Multithread Analysis of Extremely Large Simulation Traces. - Davide Appello; Paolo Bernardi; Andrea Calabrese; Giorgio Pollaccia; Stefano Quer; Vincenzo Tancorre; Roberto Ugioli (IEEE Access, 2022)

Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. - Paolo Bernardi; Gabriele Filipponi; Matteo Sonza Reorda; Davide Appello; Claudia Bertani; Vincenzo Tancorre (DDECS, 2023)

About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. - Paolo Bernardi; Lorenzo Cardone; Giusy Iaria; Davide Appello; Giuseppe Garozzo; Vincenzo Tancorre (IOLTS, 2023)

On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. - Francesco Angione; Paolo Bernardi; Riccardo Cantoro; Nicola Di Gruttola Giardino; Davide Piumatti; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre (LATS, 2023)

A guided debugger-based fault injection methodology for assessing functional test programs. - Francesco Angione; Paolo Bernardi; Nicola Di Gruttola Giardino; Davide Appello; Claudia Bertani; Vincenzo Tancorre (VTS, 2023)

A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. - Francesco Angione; Davide Appello; Paolo Bernardi; Andrea Calabrese; Stefano Quer; Matteo Sonza Reorda; Vincenzo Tancorre; Roberto Ugioli (IEEE Access, 2023)

A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. - Francesco Angione; Davide Appello; Paolo Bernardi; Claudia Bertani; Giovambattista Gallo; Stefano Littardi; Giorgio Pollaccia; Walter Ruggeri; Matteo Sonza Reorda; Vincenzo Tancorre; Roberto Ugioli (IEEE Trans. Computers, 2023)

An AI-Enabled Framework for Smart Semiconductor Manufacturing. - Khaled Sidahmed Sidahmed Alamin; Davide Appello; Alessandro Beghi; Nicola Dall'Ora; Fabio Depaoli; Santa Di Cataldo; Franco Fummi; Sebastiano Gaiardelli; Michele Lora; Enrico Macii; Alessio Mascolini; Daniele Pagano; et al. (DATE, 2024)

Testing challenges along WBG and UWBG devices roadmap. - Elena Venuti; Davide Appello; Riccardo Vettori; Federico Fazio; Rosalia Biondi; Chiara Lauria; Tiziana Bertoncelli; Giancarlo Guida; Marco Occhiali (DTTIS, 2024)

AI-Assisted Framework for Real-Time Monitoring and Management of Probe Cards in Electrical Wafer Sort Applications. - Mehdi Bejani; Davide Appello; Marco Mauri; Simone Todaro; Stefano Mariani (ETS, 2025)