Characterization of self-heating effects in semiconductor resistors during transmission line pulses. - Chiara Corvasce; Mauro Ciappa; Davide Barlini; S. Sponton; Gaudenzio Meneghesso; Wolfgang Fichtner (Microelectron. Reliab., 2004)

New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. - Davide Barlini; Mauro Ciappa; Alberto Castellazzi; Michel Mermet-Guyennet; Wolfgang Fichtner (Microelectron. Reliab., 2006)

Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current. - X. Perpiñà; Jean-François Serviere; J. Saiz; Davide Barlini; Michel Mermet-Guyennet; José Millán (Microelectron. Reliab., 2006)

Measurement of the transient junction temperature in MOSFET devices under operating conditions. - Davide Barlini; Mauro Ciappa; Michel Mermet-Guyennet; Wolfgang Fichtner (Microelectron. Reliab., 2007)

Shrinking horizon parametrized predictive control with application to energy-efficient train operation. - Hafsa Farooqi; Lorenzo Fagiano; Patrizio Colaneri; Davide Barlini (Autom., 2020)