Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture. - Davide Cornigli; Susanna Reggiani; Antonio Gnudi; Elena Gnani; Giorgio Baccarani; Davide Fabiani; Dhanoop Varghese; Enis Tuncer; S. Krishnan; Luu Nguyen (Microelectron. Reliab., 2018)

Characterization and Modeling of BTI in SiC MOSFETs. - Davide Cornigli; Andrea Natale Tallarico; Susanna Reggiani; Claudio Fiegna; Enrico Sangiorgi; Luis Sanchez; Carlos Valdivieso; Giuseppe Consentino; Felice Crupi (ESSDERC, 2019)

Low-PBTS defect-engineered high-mobility metal-oxide BEOL transistors. - Bastien Beltrando; Bruno Coppolelli; Jung-Bae Kim; Yang Ho Bae; Stephen Weeks; Lisa Enman; Ghazal Saheli; Davide Cornigli; Stuart Brinkley; Mark Saly; Luca Larcher; Dong Kil Yim; et al. (IRPS, 2024)

Characterization and Multiscale Modeling of TDDB in State-of-the-art BEOL. - Andrea Palmieri; Mahdi Tavakoli; Chi Ching; Wenkai Zheng; Shi You; Xiaodong Zhang; Davide Cornigli; Michael Haverty; Navneet Singh; Luca Larcher; Monika Jamieson; Ajay Bhatnagar; et al. (IRPS, 2024)

Impact of Al-based Dipole Formation on Gate Stack Integrity and Reliability. - Bruno Coppolelli; Davide Cornigli; Zheyuan Chen; Andrea Padovani; Sara Vecchi; Yanliu Dang; Luc Thomas; Luca Vandelli; Jianxin Lei; Naomi Yoshida; Renu Whig; Federico Nardi; et al. (IRPS, 2025)

A Novel D2 Plasma Treatment for Defect Passivation: From Modeling to Process Optimization. - Sara Vecchi; Vikram Bhosle; Andrea Palmieri; Davide Cornigli; Fabrizio Buscemi; Andrea Padovani; Deven Raj; Andrew Cockburn; Lucien Date; Gaurav Thareja; Federico Nardi; Luca Larcher (IRPS, 2025)