Process, Circuit and System Co-optimization of Wafer Level Co-Integrated FinFET with Vertical Nanosheet Selector for STT-MRAM Applications. - Trong Huynh Bao; Anabela Veloso; Sushil Sakhare; Philippe Matagne; Julien Ryckaert; Manu Perumkunnil; Davide Crotti; Farrukh Yasin; Alessio Spessot; Arnaud Furnémont; Gouri Sankar Kar; Anda Mocuta (DAC, 2019)

Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs. - Simon Van Beek; Barry J. O'Sullivan; Sebastien Couet; Davide Crotti; Dimitri Linten; Gouri Sankar Kar (IRPS, 2020)

Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution. - Simon Van Beek; Siddharth Rao; Shreya Kundu; Woojin Kim; Barry J. O'Sullivan; Stefan Cosemans; Farrukh Yasin; Robert Carpenter; Sebastien Couet; Shamin H. Sharifi; Nico Jossart; Davide Crotti; et al. (IRPS, 2021)