Read Noise Analysis in Analog Conductive-Metal-Oxide/HfOx ReRAM Devices. - Davide G. F. Lombardo; Mamidala Saketh Ram; Tommaso Stecconi; Wooseok Choi; Antonio La Porta; Donato Francesco Falcone; Bert J. Offrein; Valeria Bragaglia (DRC, 2024)