A diagnostic test pattern generation algorithm. - Paolo Camurati; Davide Medina; Paolo Prinetto; Matteo Sonza Reorda (ITC, 1990)

An industrial experience in the built-in self test of embedded RAMs. - Paolo Camurati; Paolo Prinetto; Matteo Sonza Reorda; Stefano Barbagallo; Andrea Burri; Davide Medina (VTS, 1994)

Industrial BIST of Embedded RAMs. - Paolo Camurati; Paolo Prinetto; Matteo Sonza Reorda; Stefano Barbagallo; Andrea Burri; Davide Medina (IEEE Des. Test Comput., 1995)

A Parametric Design of a Built-in Self-Test FIFO Embedded Memory. - Stefano Barbagallo; Monica Lobetti Bodoni; Davide Medina; Gabriel de Blasio; M. Ferloni; Franco Fummi; Donatella Sciuto (DFT, 1996)

Scan insertion criteria for low design impact. - Stefano Barbagallo; Monica Lobetti Bodoni; Davide Medina; Fulvio Corno; Paolo Prinetto; Matteo Sonza Reorda (VTS, 1996)

Integrating Online and Offline Testing of a Switching Memory. - Stefano Barbagallo; Davide Medina; Fulvio Corno; Paolo Prinetto; Matteo Sonza Reorda (IEEE Des. Test Comput., 1998)