Electrical characterization and analysis techniques for the high-kappa era. - Chadwin D. Young; Dawei Heh; Arnost Neugroschel; Rino Choi; Byoung Hun Lee; Gennadi Bersuker (Microelectron. Reliab., 2007)

Composition Segregation of Ge-Rich GST and Its Effect on Reliability. - Yung-Huei Lee; P. J. Liao; Vincent Hou; Dawei Heh; Chih-Hung Nien; Wen-Hsien Kuo; Gary T. Chen; Shao-Ming Yu; Yu-Sheng Chen; Jau-Yi Wu; Xinyu Bao; Carlos H. Diaz (IRPS, 2021)