Research on the structure of ultrathin Si PIN detector. - Peiquan Wang; Dayu Tian; Shaonan Wang; Min Yu; Yufeng Jin (NEMS, 2013)

A method to evaluate the influence of different substrate on stress mismatch induced deformation in MEMS accelerometer. - Jun You; Dayu Tian; Chunhua He; Qiancheng Zhao; Zhenchuan Yang; Dacheng Zhang; Guizhen Yan (NEMS, 2015)