Fabrication of high-value standard resistors. - Ronald F. Dziuba; Dean G. Jarrett; Lisa L. Scott; Andrew J. Secula (IEEE Trans. Instrum. Meas., 1999)

Evaluation of guarded high-resistance Hamon transfer standards. - Dean G. Jarrett (IEEE Trans. Instrum. Meas., 1999)

Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory. - Randolph E. Elmquist; Anne-Marie Jeffery; Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2001)

Analysis of a dual-balance high-resistance bridge at 10 TΩ. - Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2001)

CCEM-K2 key comparison of 10-MΩ and 1-GΩ resistance standards. - Dean G. Jarrett; Ronald F. Dziuba (IEEE Trans. Instrum. Meas., 2003)

Statistical uncertainty analysis of key comparison CCEM-K2. - Nien Fan Zhang; Nell Sedransk; Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2003)

Direct resistance comparisons from the QHR to100 MΩ using a cryogenic current comparator. - Randolph E. Elmquist; Emmanouel Hourdakis; Dean G. Jarrett; Neil M. Zimmerman (IEEE Trans. Instrum. Meas., 2005)

SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ. - Dean G. Jarrett; Randolph E. Elmquist; Nien Fan Zhang; Alejandra Tonina; Marta Porfiri; Janice de Brito Fernandes; Helio Schechter; Daniel Izquierdo 003; Carlos Faverio; Daniel Slomovitz; David Inglis; Kai Wendler; et al. (IEEE Trans. Instrum. Meas., 2009)

Report to TIM Editor on CPEM 2012. - Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2013)

The units for mass, voltage, resistance, and electrical current in the SI. - Stephan Schlamminger; Patrick Abbott; Zeina Kubarych; Dean G. Jarrett; Randolph E. Elmquist (IEEE Instrum. Meas. Mag., 2019)

Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards. - Albert F. Rigosi; Alireza R. Panna; Shamith U. Payagala; Mattias Kruskopf; Marlin Kraft; George R. Jones; Bi-Yi Wu; Hsin-Yen Lee; Yanfei Yang; Jiuning Hu; Dean G. Jarrett; David B. Newell; et al. (IEEE Trans. Instrum. Meas., 2019)

Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices. - Takehiko Oe; Albert F. Rigosi; Mattias Kruskopf; Bi-Yi Wu; Hsin-Yen Lee; Yanfei Yang; Randolph E. Elmquist; Nobu-hisa Kaneko; Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2020)

Comparison Between Graphene and GaAs Quantized Hall Devices With a Dual Probe. - Shamith U. Payagala; Albert F. Rigosi; Alireza R. Panna; Alessio Pollarolo; Mattias Kruskopf; Stephan Schlamminger; Dean G. Jarrett; Ryan Brown; Randolph E. Elmquist; Duane Brown; David B. Newell (IEEE Trans. Instrum. Meas., 2020)

Using a Natural Ratio to Compare DC and AC Resistances. - Kwang Min Yu; Dean G. Jarrett; Andrew D. Koffman; Albert F. Rigosi; Shamith U. Payagala; Kwon Sang Ryu; Jeon Hong Kang; Sang Hwa Lee (IEEE Trans. Instrum. Meas., 2020)

Comparison of Multiple Methods for Obtaining P $ Omega$ Resistances With Low Uncertainties. - Kwang Min Yu; Dean G. Jarrett; Albert F. Rigosi; Shamith U. Payagala; Marlin Kraft (IEEE Trans. Instrum. Meas., 2020)

Comparison of a 100-pF Capacitor With a 12 906-Ω Resistor Using a Digital Impedance Bridge. - Mona Feige; Stephan Schlamminger; Andrew D. Koffman; Dean G. Jarrett; Shamith U. Payagala; Alireza R. Panna; Bryan C. Waltrip; Mike Berilla; Frank Seifert 004; Yicheng Wang (IEEE Trans. Instrum. Meas., 2022)

Graphene-Based Star-Mesh Resistance Networks. - Dean G. Jarrett; Ching-Chen Yeh; Shamith U. Payagala; Alireza R. Panna; Yanfei Yang; Linli Meng; Swapnil M. Mhatre; Ngoc Thanh Mai Tran; Heather M. Hill; Dipanjan Saha; Randolph E. Elmquist; David B. Newell; et al. (IEEE Trans. Instrum. Meas., 2023)

Implementation of a 1 GΩ Star-Mesh Graphene Quantized Hall Array Resistance Standard Network for High Resistance Calibration. - Marta Musso; Wei-Chen Lin; Yanfei Yang; Ngoc Thanh Mai Tran; Alireza R. Panna; Cheng-Hsueh Yang; Randolph E. Elmquist; David B. Newell; Chi-Te Liang; Massimo Ortolano; Albert F. Rigosi; Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2025)