An Overview of the Applications of a Pulsed Laser System for SEU Testing. - Vincent Pouget; Pascal Fouillat; Dean Lewis; Hervé Lapuyade; L. Sarger; F. M. Roche; S. Duzellier; R. Ecoffet (IOLTW, 2000)

A New Laser System for X-Rays Flashes Sensitivity Evaluation. - Dean Lewis; Hervé Lapuyade; Yann Deval; Yvan Maidon; Frédéric Darracq; Renaud Briand; Pascal Fouillat (IOLTW, 2001)

Modeling Thermal Laser Stimulation. - Felix Beaudoin; X. Chauffleur; Jean-Pierre Fradin; Philippe Perdu; Romain Desplats; Dean Lewis (Microelectron. Reliab., 2001)

Silicon Thinning and Polishing on Packaged Devices. - Felix Beaudoin; Philippe Perdu; Romain Desplats; Sebastien Rigo; Dean Lewis (Microelectron. Reliab., 2001)

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. - Romain Desplats; Felix Beaudoin; Philippe Perdu; Patrick Poirier; David Trémouilles; Marise Bafleur; Dean Lewis (Microelectron. Reliab., 2001)

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. - Dean Lewis; Vincent Pouget; Thomas Beauchêne; Hervé Lapuyade; Pascal Fouillat; André Touboul; Felix Beaudoin; Philippe Perdu (Microelectron. Reliab., 2001)

Theoretical Investigation of an Equivalent Laser LET. - Vincent Pouget; Hervé Lapuyade; Pascal Fouillat; Dean Lewis; S. Buchner (Microelectron. Reliab., 2001)

Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. - Dean Lewis; Pascal Fouillat; Vincent Pouget (LATW, 2002)

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. - Felix Beaudoin; D. Carisetti; Romain Desplats; Philippe Perdu; Dean Lewis; J. C. Clement (Microelectron. Reliab., 2002)

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. - Felix Beaudoin; Gérald Haller; Philippe Perdu; Romain Desplats; Thomas Beauchêne; Dean Lewis (Microelectron. Reliab., 2002)

Backside Hot Spot Detection Using Liquid Crystal Microscopy. - Olivier Crépel; Felix Beaudoin; Lionel Dantas de Morais; Gérald Haller; C. Goupil; Philippe Perdu; Romain Desplats; Dean Lewis (Microelectron. Reliab., 2002)

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. - G. Andriamonje; Vincent Pouget; Yves Ousten; Dean Lewis; Yves Danto; Jean-Michel Rampnoux; Younès Ezzahri; Stefan Dilhaire; Stéphane Grauby; Wilfrid Claeys (Microelectron. Reliab., 2003)

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Romain Desplats; Pascal Fouillat; Philippe Perdu; Marise Bafleur; David Trémouilles (Microelectron. Reliab., 2003)

A physical approach on SCOBIC investigation in VLSI. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Philippe Perdu; Pascal Fouillat; Yves Danto (Microelectron. Reliab., 2003)

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). - Thomas Beauchêne; David Trémouilles; Dean Lewis; Philippe Perdu; Pascal Fouillat (Microelectron. Reliab., 2003)

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. - Felix Beaudoin; Romain Desplats; Philippe Perdu; Abdellatif Firiti; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2003)

Short defect characterization based on TCR parameter extraction. - Abdellatif Firiti; D. Faujour; Gérald Haller; J. M. Moragues; Vincent Goubier; Philippe Perdu; Felix Beaudoin; Dean Lewis (Microelectron. Reliab., 2003)

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. - Mustapha Remmach; Romain Desplats; Felix Beaudoin; E. Frances; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2003)

Time Resolved Photon Emission Processing Flow for IC Analysis. - Romain Desplats; Gaël Faggion; Mustapha Remmach; Felix Beaudoin; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2004)

Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections. - Romain Desplats; S. Petit; Sana Rezgui; Carl Carmichael; Pascal Fouillat; Dean Lewis (Microelectron. Reliab., 2004)

Study of the ESD defects impact on ICs reliability. - Fabien Essely; Corinne Bestory; Nicolas Guitard; Marise Bafleur; A. Wislez; E. Doche; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2004)

Understanding the effects of NIR laser stimulation on NMOS transistor. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2004)

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? - Mustapha Remmach; Romain Desplats; Philippe Perdu; J. P. Roux; Michel Vallet; Sylvain Dudit; P. Sardin; Dean Lewis (Microelectron. Reliab., 2004)

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. - Vincent Pouget; Dean Lewis; Pascal Fouillat (IEEE Trans. Instrum. Meas., 2004)

Electrical Modeling for Laser Testing with Different Pulse Durations. - Alexandre Douin; Vincent Pouget; Dean Lewis; Pascal Fouillat; Philippe Perdu (IOLTS, 2005)

Impact of semiconductors material on IR Laser Stimulation signal. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2005)

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. - Nicolas Guitard; Fabien Essely; David Trémouilles; Marise Bafleur; Nicolas Nolhier; Philippe Perdu; André Touboul; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2005)

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. - Mustapha Remmach; A. Pigozzi; Romain Desplats; Philippe Perdu; Dean Lewis; J. Noel; Sylvain Dudit (Microelectron. Reliab., 2005)

NIR laser stimulation for dynamic timing analysis. - Kevin Sanchez; Romain Desplats; Felix Beaudoin; Philippe Perdu; J. P. Roux; G. Woods; Dean Lewis (Microelectron. Reliab., 2005)

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. - Alexandre Douin; Vincent Pouget; M. De Matos; Dean Lewis; Philippe Perdu; Pascal Fouillat (Microelectron. Reliab., 2006)

Application of various optical techniques for ESD defect localization. - Fabien Essely; Frédéric Darracq; Vincent Pouget; Mustapha Remmach; Felix Beaudoin; Nicolas Guitard; Marise Bafleur; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2006)

Identification of process/design issues during 0.18 µm technology qualification for space application. - Julie Ferrigno; Philippe Perdu; Kevin Sanchez; Dean Lewis (DATE, 2007)

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. - Vincent Pouget; Alexandre Douin; Gilles Foucard; Paul Peronnard; Dean Lewis; Pascal Fouillat; Raoul Velazco (IOLTS, 2008)

Generic simulator for faulty IC. - Julie Ferrigno; Aziz Machouat; Philippe Perdu; Dean Lewis; Gérald Haller; Vincent Goubier (Microelectron. Reliab., 2008)

Effect of physical defect on shmoos in CMOS DSM technologies. - Aziz Machouat; Gérald Haller; Vincent Goubier; Dean Lewis; Philippe Perdu; Vincent Pouget; Pascal Fouillat; Fabien Essely (Microelectron. Reliab., 2008)

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. - Magdalena Sienkiewicz; Philippe Perdu; Abdellatif Firiti; Kevin Sanchez; Olivier Crépel; Dean Lewis (Microelectron. Reliab., 2008)

Electrical modeling of the effect of beam profile for pulsed laser fault injection. - C. Godlewski; Vincent Pouget; Dean Lewis; Mathieu Lisart (Microelectron. Reliab., 2009)

Net integrity checking by optical localization techniques. - Gérald Haller; Aziz Machouat; Dean Lewis; Vincent Pouget (Microelectron. Reliab., 2009)

Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package. - Fulvio Infante; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2009)

Editorial. - Dean Lewis; Nathalie Labat (Microelectron. Reliab., 2009)

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). - Guillaume Celi; Sylvain Dudit; Philippe Perdu; Antoine Reverdy; Thierry Parrassin; Emmanuel Bechet; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2010)

CADless laser assisted methodologies for failure analysis and device reliability. - A. Deyine; Kevin Sanchez; Philippe Perdu; F. Battistella; Dean Lewis (Microelectron. Reliab., 2010)

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations. - Fulvio Infante; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2010)

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. - Guillaume Bascoul; Philippe Perdu; A. Benigni; Sylvain Dudit; Guillaume Celi; Dean Lewis (Microelectron. Reliab., 2011)

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. - Guillaume Celi; Sylvain Dudit; Thierry Parrassin; Philippe Perdu; Antoine Reverdy; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2011)

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. - Fulvio Infante; Philippe Perdu; H. B. Kor; Chee Lip Gan; Dean Lewis (Microelectron. Reliab., 2011)

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. - Roxane Llido; J. Gomez; Vincent Goubier; N. Froidevaux; L. Dufayard; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2011)

High performance thermography with InGaAs photon counting camera. - Guillaume Bascoul; Philippe Perdu; Maryse Béguin; Dean Lewis (Microelectron. Reliab., 2012)

Effects of 1064 nm laser on MOS capacitor. - R. Llido; Pascal Masson; Arnaud Régnier; Vincent Goubier; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2012)

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. - Alexandre Sarafianos; Roxane Llido; Jean-Max Dutertre; Olivier Gagliano; Valerie Serradeil; Mathieu Lisart; Vincent Goubier; Assia Tria; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2012)

Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. - Nogaye Mbaye; Vincent Pouget; Frédéric Darracq; Dean Lewis (Microelectron. Reliab., 2013)

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. - I. El Moukhtari; Vincent Pouget; C. Larue; Frédéric Darracq; Dean Lewis; Philippe Perdu (Microelectron. Reliab., 2013)

A comprehensive study of the application of the EOP techniques on bipolar devices. - Mohamed Mehdi Rebaï; Frédéric Darracq; Jean-Paul Guillet; Elise Bernou; Kevin Sanchez; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2014)

A way to implement the electro-optical technique to inertial MEMS. - Kevin Melendez; A. Desmoulin; Kevin Sanchez; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2015)