Adaptive linearization of hybrid step motors: stability analysis. - Degang Chen 001; Brad E. Paden (IEEE Trans. Autom. Control., 1993)

Application of Kharitonov's theorem to mechanical systems. - Tesfay Meressi; Degang Chen 001; Brad E. Paden (IEEE Trans. Autom. Control., 1993)

Control of free-flying underactuated space manipulators to equilibrium manifolds. - Ranjan Mukherjee; Degang Chen 001 (IEEE Trans. Robotics Autom., 1993)

Optimal motion planning for flexible space robots. - Hongchao Zhao; Degang Chen 001 (ICRA, 1996)

Nonlinear inversion-based output tracking. - Santosh Devasia; Degang Chen 001; Brad Paden (IEEE Trans. Autom. Control., 1996)

A finite energy property of stable inversion to nonminimum phase nonlinear systems. - Hongchao Zhao; Degang Chen 001 (IEEE Trans. Autom. Control., 1998)

Feedback control strategies for a nonholonomic mobile robot using a nonlinear oscillator. - Ranjan Mukherjee; Degang Chen 001; Gangbing Song (J. Field Robotics, 1999)

Adaptive learning control for nonminimum phase systems. - Xuezhen Wang; D. J. Chen 001 (SMC, 2000)

Automatic landing control using H∞ control and stable inversion. - Jun Che; Degang Chen 001 (CDC, 2001)

Causal inversion of nonminimum phase systems. - Xuezhen Wang; Degang Chen 001 (CDC, 2001)

A low-voltage compatible two-stage amplifier with ≥120 dB gain in standard digital CMOS. - Chengming He; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2003)

A deterministic dynamic element matching approach to ADC testing. - Beatriz Olleta; Lance Juffer; Degang Chen 001; Randall L. Geiger (ISCAS (5), 2003)

Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. - Kumar L. Parthasarathy; Le Jin; Turker Kuyel; Dana Price; Degang Chen 001; Randall L. Geiger (ISCAS (5), 2003)

1-D and 2-D switching strategies achieving near optimal INL for thermometer-coded current steering DACs. - Zhongjun Yu; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2003)

Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. - Le Jin; Kumar L. Parthasarathy; Turker Kuyel; Degang Chen 001; Randall L. Geiger (ITC, 2003)

BIST and production testing of ADCs using imprecise stimulus. - Kumar L. Parthasarathy; Turker Kuyel; Dana Price; Le Jin; Degang Chen 001; Randall L. Geiger (ACM Trans. Design Autom. Electr. Syst., 2003)

Optimum area allocation for resistors and capacitors in continuous-time monolithic filters. - Haibo Fei; Randall L. Geiger; Degang Chen 001 (ISCAS (1), 2004)

Robust design of high gain amplifiers using dynamical systems and bifurcation theory. - Chengming He; Le Jin; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

NTH order circular symmetry pattern and hexagonal tesselation: two new layout techniques cancelling nonlinear gradient. - Chengming He; Kuangming Yap; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

A background digital self-calibration scheme for pipelined ADCs based on transfer curve estimation. - Hanjun Jiang; Haibo Fei; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. - Le Jin; Chengming He; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. - Le Jin; Chengming He; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

Testing high resolution ADCs using deterministic dynamic element matching. - Beatriz Olleta; Hanjun Jiang; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing. - Beatriz Olleta; Hanjun Jiang; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

A novel 1.5 V CMFB CMOS down-conversion mixer design for IEEE 802.11 A WLAN systems. - Xuezhen Wang; Robert Weber; Degang Chen 001 (ISCAS (4), 2004)

The SRE/SRM approach for spectral testing of AMS circuits. - Zhongjun Yu; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations. - Zhongjun Yu; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling. - Zhongjun Yu; Degang Chen 001; Randall L. Geiger (ITC, 2004)

An adaptive, truly background calibration method for high speed pipeline ADC design. - Degang Chen 001; Zhongjun Yu; Randall L. Geiger (ISCAS (6), 2005)

A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs. - Xin Dai; Degang Chen 001; Randall L. Geiger (ISCAS (5), 2005)

An Nth order central symmetrical layout pattern for nonlinear gradients cancellation. - Xin Dai; Chengming He; Hanqing Xing; Degang Chen 001; Randall L. Geiger (ISCAS (5), 2005)

Dither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACs. - Hanjun Jiang; Degang Chen 001; Randall L. Geiger (ISCAS (5), 2005)

A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. - Le Jin; Degang Chen 001; Randall L. Geiger (ISCAS (2), 2005)

A test strategy for time-to-digital converters using dynamic element matching and dithering. - Wenbo Liu; Hanqing Xing; Le Jin; Randall L. Geiger; Degang Chen 001 (ISCAS (4), 2005)

A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test. - Beatriz Olleta; Hanjun Jiang; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2005)

A two-step DDEM ADC for accurate and cost-effective DAC testing. - Hanqing Xing; Degang Chen 001; Randall L. Geiger (ISCAS (5), 2005)

Pipeline ADC linearity testing with dramatically reduced data capture time. - Zhongjun Yu; Degang Chen 001; Randall L. Geiger; Ioannis Papantonopoulos (ISCAS (1), 2005)

High-performance ADC linearity test using low-precision signals in non-stationary environments. - Le Jin; Kumar L. Parthasarathy; Turker Kuyel; Randall L. Geiger; Degang Chen 001 (ITC, 2005)

A 16-bit resistor string DAC with full-calibration at final test. - Kumar L. Parthasarathy; Turker Kuyel; Zhongjun Yu; Degang Chen 001; Randall L. Geiger (ITC, 2005)

Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. - Le Jin; Kumar L. Parthasarathy; Turker Kuyel; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2005)

A New High Precision Low Offset Dynamic Comparator for High Resolution High Speed ADCs. - Vipul Katyal; Randall L. Geiger; Degang Chen 001 (APCCAS, 2006)

Explicit characterization of bandgap references. - Xin Dai; Degang Chen 001; Randall L. Geiger (ISCAS, 2006)

A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. - Le Jin; Hanqing Xing; Degang Chen 001; Randall L. Geiger (ISCAS, 2006)

Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs. - Hanqing Xing; Degang Chen 001; Randall L. Geiger (ISCAS, 2006)

Characterization of a current-mode bandgap circuit structure for high-precision reference applications. - Hanqing Xing; Le Jin; Degang Chen 001; Randall L. Geiger (ISCAS, 2006)

Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. - Le Jin; Degang Chen 001; Randall L. Geiger (ITC, 2006)

Testing of Precision DACs Using Low-Resolution ADCs with Dithering. - Le Jin; Hosam Haggag; Randall L. Geiger; Degang Chen 001 (ITC, 2006)

Yield enhancement with optimal area allocation for ratio-critical analog circuits. - Yu Lin; Degang Chen 001; Randall L. Geiger (IEEE Trans. Circuits Syst. I Regul. Pap., 2006)

Output tracking control of a one-link flexible manipulator via causal inversion. - Xuezhen Wang; Degang Chen 001 (IEEE Trans. Control. Syst. Technol., 2006)

A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations. - Beatriz Olleta; Hanjun Jiang; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2006)

Deterministic DEM DAC Performance Analysis. - Hanjun Jiang; Degang Chen 001; Randall L. Geiger (ISCAS, 2007)

A fully digital-compatible BIST strategy for ADC linearity testing. - Hanqing Xing; Hanjun Jiang; Degang Chen 001; Randall L. Geiger (ITC, 2007)

Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques. - Chengming He; Le Jin; Degang Chen 001; Randy Geiger (IEEE Trans. Circuits Syst. I Regul. Pap., 2007)

Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. - Hanjun Jiang; Beatriz Olleta; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2007)

SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. - Le Jin; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2007)

An overview and behavioral modeling of higher order multi-bit SigmaDelta A/D converters. - Vaibhav Kumar; Degang Chen 001 (EIT, 2008)

On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering. - Hanqing Xing; Degang Chen 001; Randall L. Geiger (EIT, 2008)

A simple and accurate method to predict offset voltage in dynamic comparators. - Jun He; Sanyi Zhan; Degang Chen 001; Randall L. Geiger (ISCAS, 2008)

Adjustable hysteresis CMOS Schmitt triggers. - Vipul Katyal; Randall L. Geiger; Degang Chen 001 (ISCAS, 2008)

System identification -based reduced-code testing for pipeline ADCs' linearity test. - Hanqing Xing; Degang Chen 001; Randall L. Geiger; Le Jin (ISCAS, 2008)

Testing of Precision DAC Using Low-Resolution ADC With Wobbling. - Le Jin; Hosam Haggag; Randall L. Geiger; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2008)

Signal generators for cost effective BIST of ADCs. - Bharath K. Vasan; Jingbo Duan; Chen Zhao; Randall L. Geiger; Degang Chen 001 (ECCTD, 2009)

Cost Effective Signal Generators for ADC BIST. - Jingbo Duan; Degang Chen 001; Randall L. Geiger (ISCAS, 2009)

Optimal Area and Impedance Allocation for Dual-string DACs. - Thu T. Duong; Degang Chen 001; Randall L. Geiger (ISCAS, 2009)

Analyses of Static and Dynamic Random Offset Voltages in Dynamic Comparators. - Jun He; Sanyi Zhan; Degang Chen 001; Randall L. Geiger (IEEE Trans. Circuits Syst. I Regul. Pap., 2009)

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. - Le Jin; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2009)

High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy. - Hanqing Xing; Hanjun Jiang; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2009)

Phase control of triangular stimulus generator for ADC BIST. - Jingbo Duan; Degang Chen 001; Randall L. Geiger (ISCAS, 2010)

INL based dynamic performance estimation for ADC BIST. - Jingbo Duan; Le Jin; Degang Chen 001 (ISCAS, 2010)

Detailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators. - Jun He; Degang Chen 001; Randall L. Geiger (ISCAS, 2010)

Linearity testing of ADCs using low linearity stimulus and Kalman filtering. - Bharath K. Vasan; Randall L. Geiger; Degang Chen 001 (ISCAS, 2010)

New calibration technique for current-steering DACs. - Tao Zeng; Degang Chen 001 (ISCAS, 2010)

Output impedance linearization technique for current-steering DACs. - Tao Zeng; Degang Chen 001 (ISCAS, 2010)

A new method for estimating spectral performance of ADC from INL. - Jingbo Duan; Le Jin; Degang Chen 001 (ITC, 2010)

SNR measurement based on linearity test for ADC BIST. - Jingbo Duan; Degang Chen 001 (ISCAS, 2011)

Linear vt-based temperature sensors with low process sensitivity and improved power supply headroom. - Chen Zhao; Jun He; Sheng-Huang Lee; Karl Peterson; Randall L. Geiger; Degang Chen 001 (ISCAS, 2011)

A novel robust and accurate spectral testing method for non-coherent sampling. - Siva Sudani; Minshun Wu; Degang Chen 001 (ITC, 2011)

A low cost method for testing offset and gain error for ADC BIST. - Jingbo Duan; Degang Chen 001; Randall L. Geiger (ISCAS, 2012)

Sinusoidal signal generation for production testing and BIST applications. - Bharath K. Vasan; Siva Sudani; Degang Chen 001; Randall L. Geiger (ISCAS, 2012)

A compact low-power supply-insensitive CMOS current reference. - Chen Zhao; Randall L. Geiger; Degang Chen 001 (ISCAS, 2012)

Algorithm for dramatically improved efficiency in ADC linearity test. - Zhongjun Yu; Degang Chen 001 (ITC, 2012)

Reliability modeling of metal interconnects with time-dependent electrical and thermal stress. - Srijita Patra; Degang Chen 001; Randy Geiger (MWSCAS, 2012)

An on-chip inductive impedance measurement method with adaptive measurement range control for MWM-array based NDE applications. - Yulong Shi; Degang Chen 001 (MWSCAS, 2012)

A method for accurate full spectrum testing without requiring coherency. - Siva Sudani; Degang Chen 001; Randy Geiger (MWSCAS, 2012)

Performance verification of start-up circuits in reference generators. - Yen-Ting Wang; Chen Zhao; Randall L. Geiger; Degang Chen 001; Shu-Chuan Huang (MWSCAS, 2012)

On Chip Signal Generators for Low Overhead ADC BIST. - Jingbo Duan; Bharath K. Vasan; Chen Zhao; Degang Chen 001; Randall L. Geiger (J. Electron. Test., 2012)

An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency. - Minshun Wu; Degang Chen 001; Jingbo Duan (J. Electron. Test., 2012)

ADC jitter estimation using a single frequency test without requiring coherent sampling. - Minshun Wu; Guican Chen; Degang Chen 001 (IEICE Electron. Express, 2012)

Testing ADC Spectral Performance Without Dedicated Data Acquisition. - Jingbo Duan; Le Jin; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2012)

New Spectral Leakage-Removing Method for Spectral Testing of Approximate Sinusoidal Signals. - Minshun Wu; Degang Chen 001; Guican Chen (IEEE Trans. Instrum. Meas., 2012)

A 15-bit binary-weighted current-steering DAC with ordered element matching. - Tao Zeng; Kevin Townsend; Jingbo Duan; Degang Chen 001 (CICC, 2013)

ADC spectral testing allowing amplitude clipping. - Li Xu; Degang Chen 001 (I2MTC, 2013)

A high resolution and high accuracy R-2R DAC based on ordered element matching. - You Li 002; Tao Zeng; Degang Chen 001 (ISCAS, 2013)

Reliability degradation with electrical, thermal and thermal gradient stress in interconnects. - Srijita Patra; Degang Chen 001; Randy Geiger (ISCAS, 2013)

High resolution ADC spectral test with known impure source and non-coherent sampling. - Siva Sudani; Degang Chen 001; Randall L. Geiger (ISCAS, 2013)

Practical methods for verifying removal of Trojan stable operating points. - Yen-Ting Wang; Degang Chen 001; Randall L. Geiger (ISCAS, 2013)

A CMOS on-chip temperature sensor with -0.21°C 0.17 °C inaccuracy from -20 °C to 100 °C. - Chen Zhao; Yen-Ting Wang; David Genzer; Degang Chen 001; Randall L. Geiger (ISCAS, 2013)

Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations. - Degang Chen 001; Zhongjun Yu; Krunal Maniar; Mojtaba Nowrozi (ITC, 2013)

Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping. - Siva Sudani; Li Xu; Degang Chen 001 (ITC, 2013)

Effectiveness of circuit-level continuation methods for Trojan State Elimination verification. - Yen-Ting Wang; Degang Chen 001; Randall L. Geiger (MWSCAS, 2013)

Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique. - Bharath Karthik Vasan; Siva Kumar Sudani; Degang Chen 001; Randall L. Geiger (IEEE Trans. Circuits Syst. I Regul. Pap., 2013)

An Order-Statistics Based Matching Strategy for Circuit Components in Data Converters. - Tao Zeng; Degang Chen 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2013)

FIRE: A Fundamental Identification and Replacement Method for Accurate Spectral Test Without Requiring Coherency. - Siva Kumar Sudani; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2013)

A high gain operational amplifier via an efficient conductance cancellation technique. - Bin Huang; Degang Chen 001 (CICC, 2014)

Efficient analog verification against Trojan states using divide and contraction method. - You Li 002; Degang Chen 001 (ISCAS, 2014)

Identification and break of positive feedback loops in Trojan States Vulnerable Circuits. - Zhiqiang Liu; You Li 002; Yan Duan; Randall L. Geiger; Degang Chen 001 (ISCAS, 2014)

Fast co-test of linearity and spectral performance with non-coherent sampled and amplitude clipped data. - Li Xu; Degang Chen 001 (ITC, 2014)

An effective conductance cancellation method with minimal design effort. - Bin Huang; Degang Chen 001 (MWSCAS, 2014)

A simple slew rate enhancement technique with improved linearity and preserved small signal performance. - Bin Huang; Degang Chen 001 (MWSCAS, 2014)

A CMOS supply-insensitive with 13ppm/°C temperature coefficient current reference. - Yen-Ting Wang; Degang Chen 001; Randall L. Geiger (MWSCAS, 2014)

Challenges and opportunities for determining presence of multiple equilibrium points with circuit simulators. - Qianqian Wang; Randall L. Geiger; Degang Chen 001 (MWSCAS, 2014)

Auto-identification of positive feedback loops in multi-state vulnerable circuits. - Zhiqiang Liu; You Li 002; Randall L. Geiger; Degang Chen 001 (VTS, 2014)

Accurate and efficient method of jitter and noise separation and its application to ADC testing. - Li Xu; Degang Chen 001 (VTS, 2014)

Efficient Spectral Testing With Clipped and Noncoherently Sampled Data. - Li Xu; Siva Kumar Sudani; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2014)

Performance enhancement induced Trojan states in op-amps, their detection and removal. - Chongli Cai; Degang Chen 001 (ISCAS, 2015)

High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST. - Yan Duan; Tao Chen 006; Zhiqiang Liu; Xu Zhang; Degang Chen 001 (ISCAS, 2015)

A novel 20-bit R-2R DAC structure based on ordered element matching. - You Li 002; Degang Chen 001 (ISCAS, 2015)

A programmable temperature trigger circuit. - Qianqian Wang; Randall L. Geiger; Degang Chen 001 (ISCAS, 2015)

Direct temperature to digital converters with low supply sensitivity for power/thermal management. - Yen-Ting Wang; Chen Zhao; Degang Chen 001; Randall L. Geiger (ISCAS, 2015)

Accurate spectral testing of analog-to-digital converters with frequency drift using phase correction and averaging. - Li Xu; Degang Chen 001 (ISCAS, 2015)

A low cost jitter estimation and ADC spectral testing method. - Li Xu; Degang Chen 001 (ISCAS, 2015)

An integrated circuit solution of thermal noise thermometer with cascaded pre-amplifier and 6-bit resolution analog-to-digital converter. - Xu Zhang; Degang Chen 001 (ISCAS, 2015)

Cascode and transconductance with capacitances feedback compensation for multistage amplifiers driving no load and 1nF capacitive load. - Xu Zhang; Chongli Cai; Degang Chen 001; Gregory Blum (ISCAS, 2015)

A calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit. - Xu Zhang; Chongli Cai; Hao Meng; Siva Sudani; Randall L. Geiger; Degang Chen 001 (ISCAS, 2015)

A slew-rate enhancement technique for fully differential amplifier without inducing Trojan state. - Chongli Cai; Degang Chen 001 (MWSCAS, 2015)

A hardware Trojan embedded in the Inverse Widlar reference generator. - Xing Cao; Qianqian Wang; Randall L. Geiger; Degang Chen 001 (MWSCAS, 2015)

Switched-compensation technique in switched-capacitor circuit for achieving fast settling performance. - Jiaming Liu; Hao Meng; Degang Chen 001 (MWSCAS, 2015)

A simple ramp generator with level spreading for SEIR based ADC BIST circuit. - Hao Meng; Degang Chen 001 (MWSCAS, 2015)

Effect of flicker noise on SEIR for accurate ADC linearity testing. - Yuming Zhuang; Tao Chen 006; Shravan K. Chaganti; Degang Chen 001 (MWSCAS, 2015)

Ultrafast stimulus error removal algorithm for ADC linearity test. - Tao Chen 006; Degang Chen 001 (VTS, 2015)

A low cost jitter separation and characterization method. - Li Xu; Yan Duan; Degang Chen 001 (VTS, 2015)

A Comparative Study of State-of-the-Art High-Performance Spectral Test Methods. - Siva Kumar Sudani; Li Xu; Degang Chen 001 (IEEE Des. Test, 2015)

Extracting random jitter and sinusoidal jitter in ADC output with a single frequency test. - Minshun Wu; Zhiqiang Liu; Degang Chen 001 (IEICE Electron. Express, 2015)

Low-cost dithering generator for accurate ADC linearity test. - Yan Duan; Tao Chen 006; Degang Chen 001 (ISCAS, 2016)

Toward complete analog fault coverage with minimal observation points using a fault propagation graph. - Zhiqiang Liu; Shravan K. Chaganti; Degang Chen 001 (ISCAS, 2016)

New strategies in removing non-coherency from signals with large distortion to noise ratios. - Yuming Zhuang; Degang Chen 001 (ISCAS, 2016)

Low cost ultra-pure sine wave generation with self calibration. - Yuming Zhuang; Akhilesh Kesavan Unnithan; Arun Joseph; Siva Sudani; Benjamin Magstadt; Degang Chen 001 (ITC, 2016)

Accurate spectral testing with non-coherent sampling for large distortion to noise ratios. - Yuming Zhuang; Degang Chen 001 (VTS, 2016)

Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise. - Yuming Zhuang; Tao Chen 006; Shravan K. Chaganti; Degang Chen 001 (VTS, 2016)

New Strategies in Removing Noncoherency From Signals With Large Distortion-to-Noise Ratios. - Yuming Zhuang; Degang Chen 001 (IEEE Trans. Circuits Syst. II Express Briefs, 2016)

Accurate Spectral Testing With Impure Source and Noncoherent Sampling. - Benjamin Magstadt; Yuming Zhuang; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2016)

A voltage reference generator targeted at extracting the silicon bandgap Vgo from Vbe. - Zhiqiang Liu; Degang Chen 001 (ISCAS, 2017)

A digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection. - Zhiqiang Liu; Nanqi Liu; Shravan K. Chaganti; Degang Chen 001; Amitava Majumdar 002 (ISCAS, 2017)

Accurate spectral testing of the signals with amplitude drift. - Yuming Zhuang; Degang Chen 001 (ISCAS, 2017)

An on-chip ADC BIST solution and the BIST enabled calibration scheme. - Xiankun Jin; Tao Chen 006; Mayank Jain; Arun Kumar Barman; David Kramer; Doug Garrity; Randall L. Geiger; Degang Chen 001 (ITC, 2017)

Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter. - Li Xu; Yuming Zhuang; Rajavelu Thinakaran; Kenneth M. Butler; Degang Chen 001 (ITC, 2017)

Accurate and robust spectral testing with relaxed instrumentation requirements. - Yuming Zhuang; Degang Chen 001 (ITC, 2017)

Systematic and random mismatch characterization in device arrays. - Nanqi Liu; Chris Lash; Jim Todsen; Degang Chen 001 (MWSCAS, 2017)

Practical linear and quadratic gradient errors suppression techniques in string DACs. - Nanqi Liu; Chris Lash; Jim Todsen; Degang Chen 001 (MWSCAS, 2017)

Technique for generating timing skew resistant time-interleaved signals. - Qianqian Wang; Degang Chen 001; Randall L. Geiger (MWSCAS, 2017)

A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter. - Shravan K. Chaganti; Li Xu; Degang Chen 001 (VTS, 2017)

Accurate jitter decomposition in high-speed links. - Yan Duan; Degang Chen 001 (VTS, 2017)

A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm. - Yan Duan; Tao Chen 006; Degang Chen 001 (J. Electron. Test., 2017)

ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling. - Yuming Zhuang; Degang Chen 001 (J. Electron. Test., 2017)

Efficient Verification Against Undesired Operating Points for MOS Analog Circuits. - You Li 002; Zhiqiang Liu; Degang Chen 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2017)

Accurate Spectral Testing With Non-Coherent Sampling for Multi-Tone Test. - Yuming Zhuang; Degang Chen 001 (IEEE Trans. Circuits Syst. II Express Briefs, 2017)

Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Noncoherency and Large Distortion. - Yuming Zhuang; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2017)

Accurate Spectral Testing With Arbitrary Noncoherency in Sampling and Simultaneous Drifts in Amplitude and Frequency. - Yuming Zhuang; Li Xu; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2017)

Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME). - Shravan K. Chaganti; Tao Chen 006; Yuming Zhuang; Degang Chen 001 (I2MTC, 2018)

Cost-effective accurate DAC-ADC co-testing and DAC linearization. - Yuming Zhuang; Degang Chen 001 (I2MTC, 2018)

A low-cost jitter separation and ADC spectral testing method without requiring coherent sampling. - Shravan K. Chaganti; Li Xu; Degang Chen 001 (ISCAS, 2018)

Concurrent Sampling with Local Digitization - An Alternative to Analog Test Bus. - Nanqi Liu; Shravan K. Chaganti; Zhiqiang Liu; Degang Chen 001; Amitava Majumdar 002 (ISCAS, 2018)

A Transient-Enhanced Fully-Integrated LDO Regulator for SoC Application. - Nanqi Liu; Brian Johnson; Vinay Nadig; Degang Chen 001 (ISCAS, 2018)

A High Constancy Rail-to-rail Level Shift Generator for SEIR-based BIST circuit for ADCs. - Hao Meng; Randall L. Geiger; Degang Chen 001 (ISCAS, 2018)

Transparent side channel trigger mechanism on analog circuits with PAAST hardware Trojans. - Qianqian Wang; Degang Chen 001; Randall L. Geiger (ISCAS, 2018)

Accurate Spectral Testing with Impure Test Stimulus for Multi-tone Test. - Yuming Zhuang; Degang Chen 001 (ITC-Asia, 2018)

Cost-Effective High Purity Signal Generator Using Pre-distortion. - Yuming Zhuang; Degang Chen 001 (ITC-Asia, 2018)

Fast and accurate linearity test for DACs with various architectures using segmented models. - Shravan K. Chaganti; Abalhassan Sheikh; Sumit Dubey; Frank Ankapong; Nitin Agarwal; Degang Chen 001 (ITC, 2018)

USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. - Tao Chen 006; Xiankun Jin; Randall L. Geiger; Degang Chen 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit. - Zhiqiang Liu; Shravan K. Chaganti; Degang Chen 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing. - Yuming Zhuang; Benjamin Magstadt; Tao Chen 006; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2018)

Bandgap Voltage VGO Extraction with Two-Temperature Trimming for Designing Sub-ppm/°C Voltage References. - Nanqi Liu; Randy Geiger; Degang Chen 001 (ISCAS, 2019)

Built-in self-test and self-calibration for analog and mixed signal circuits. - Tao Chen 006; Degang Chen 001 (ITC, 2019)

A Precision Bandgap Voltage Reference Using Curvature Elimination Technique. - Pallavi Ebenezer; Tyler Archer; Degang Chen 001; Randall L. Geiger (MWSCAS, 2019)

An Accurate and Efficient Method for Eliminating the Requirement of Coherent Sampling in Multi-Tone Test. - Cheng Ban; Minshun Wu; Jiangtao Xu; Li Geng; Degang Chen 001 (VTS, 2019)

Low-Cost, High-Precision DAC Design Based on Ordered Element Matching. - You Li 002; Degang Chen 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2019)

A Simple Bandgap Reference Based on VGO Extraction with Single-Temperature Trimming. - Pangzhou Li; Nanqi Liu; Degang Chen 001 (ISCAS, 2020)

A Low-Power and Area-Efficient Analog Duty Cycle Corrector for ADC's External Clocks. - Nanqi Liu; Jim Todsen; Degang Chen 001 (ISCAS, 2020)

Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage. - Marampally Saikiran; Mona Ganji; Degang Chen 001 (ITC, 2020)

Least Square Based Jitter Decomposition Algorithm for a PAM4 link. - Kushagra Bhatheja; Srikanth Jagannathan; Degang Chen 001 (MWSCAS, 2020)

Three-Junction Bandgap Circuit with Sub 1 ppm/°C Temperature Coefficient. - Pallavi Sugantha Ebenezer; Vijayalakshmi Naganadhan; Degang Chen 001; Randall L. Geiger (MWSCAS, 2020)

Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing. - Praise O. Farayola; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (VTS, 2020)

A Transient-Enhanced Output-Capacitorless LDO With Fast Local Loop and Overshoot Detection. - Nanqi Liu; Degang Chen 001 (IEEE Trans. Circuits Syst., 2020)

An 8-bit Low-Cost String DAC With Gradient Errors Suppression to Achieve 16-bit Linearity. - Nanqi Liu; Jim Todsen; Degang Chen 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2020)

A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier. - Chulhyun Park; Tao Chen 006; Kyoohyun Noh; Dadian Zhou; Suraj Prakash; Mohammadhossein Naderi Alizadeh; Aydin I. Karsilayan; Degang Chen 001; Randall L. Geiger; José Silva-Martínez (IEEE Trans. Circuits Syst., 2020)

An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. - Tao Chen 006; Chulhyun Park; Shravan K. Chaganti; José Silva-Martínez; Randall L. Geiger; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2020)

A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test. - Tao Chen 006; Chulhyun Park; Hao Meng; Dadian Zhou; José Silva-Martínez; Randall L. Geiger; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2020)

MIRE: A Multitone Identification and Replacement Method for Multitone Spectral Test Without Requiring Coherent Sampling. - Minshun Wu; Cheng Ban; Jiangtao Xu; Li Geng; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2020)

Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (DTIS, 2021)

An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. - Isaac Bruce; Praise O. Farayola; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ETS, 2021)

Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ITC, 2021)

A Simple Monitor for Tracking NBTI in Integrated Systems. - Matthew R. Strong; Kushagra Bhatheja; Ruohan Yang; Degang Chen 001 (MWSCAS, 2021)

Sub-ppm/°C Bandgap References With Natural Basis Expansion for Curvature Cancellation. - Nanqi Liu; Randall L. Geiger; Degang Chen 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2021)

Fast Gate Leakage Current Monitor With Large Dynamic Range. - Kushagra Bhatheja; Xiankun Jin; Matthew R. Strong; Degang Chen 001 (IEEE Trans. Circuits Syst. II Express Briefs, 2021)

Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing. - Praise O. Farayola; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2021)

Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (DFT, 2022)

Graph Theory Approach for Multi-site ATE Board Parameter Extraction. - Abraham Steenhoek; Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ETS, 2022)

All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage. - Michael Sekyere; Marampally Saikiran; Degang Chen 001 (IOLTS, 2022)

Hardware Security Vulnerability in Analog Signal Chain Filters. - Kwabena Oppong Banahene; Matthew R. Strong; Bryce Gadogbe; Degang Chen 001; Randall L. Geiger (ISCAS, 2022)

Level Shifters for Charge Constrained Applications. - Kushagra Bhatheja; Matthew R. Strong; Degang Chen 001 (ISCAS, 2022)

A Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models. - Mona Ganji; Marampally Saikiran; Degang Chen 001 (ISCAS, 2022)

Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection. - Marampally Saikiran; Mona Ganji; Degang Chen 001 (ISCAS, 2022)

Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing. - Kushagra Bhatheja; Shravan K. Chaganti; Degang Chen 001; Xiankun Robert Jin; Chris C. Dao; Juxiang Ren; Abhishek Kumar; Daniel Correa; Mark Lehmann; Thomas Rodriguez; Eric Kingham; Joel R. Knight; et al. (ITC, 2022)

Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ITC, 2022)

A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits. - Marampally Saikiran; Mona Ganji; Degang Chen 001 (SBCCI, 2022)

Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators. - Marampally Saikiran; Mona Ganji; Degang Chen 001 (SBCCI, 2022)

The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (VTS, 2022)

All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis. - Mona Ganji; Marampally Saikiran; Degang Chen 001 (VTS, 2022)

A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (J. Electron. Test., 2022)

Systematic Methodology to Design High Precision Voltage References with Sub-ppm/°C Temperature Coefficient. - Vijayalakshmi Naganadhan; Marampally Saikiran; Mahmoud Gshash; Degang Chen 001 (EWDTS, 2023)

Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview. - Marampally Saikiran; Michael Sekyere; Mona Ganji; Degang Chen 001 (EWDTS, 2023)

Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency. - Marampally Saikiran; Michael Sekyere; Mona Ganji; Degang Chen 001 (EWDTS, 2023)

A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers. - Michael Sekyere; Marampally Saikiran; Degang Chen 001 (EWDTS, 2023)

A Resistorless Precision Curvature-Compensated Bandgap Voltage Reference Based on the VGO Extraction Technique. - Daniel Adjei; Bryce Gadogbe; Degang Chen 001; Randall L. Geiger (ISCAS, 2023)

Sub-ppm/°C High Performance Voltage Reference. - Bryce Gadogbe; Daniel Adjei; Kwabena Oppong Banahene; Randall L. Geiger; Degang Chen 001 (ISCAS, 2023)

An Improved Single-Temperature Trim Technique for 1st Order-Compensated Bandgap References. - Daniel Adjei; Bryce Gadogbe; Degang Chen 001; Randall L. Geiger; Shravan K. Chaganti; Dhyey Desai; Jerry Doorenbos; Jim Todsen (MWSCAS, 2023)

An Architectural Framework for On-Line Health Monitoring of Integrated Circuits. - Kushagra Bhatheja; Degang Chen 001 (MWSCAS, 2023)

Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm. - Isaac Bruce; Michael Sekyere; Emmanuel Nti Darko; Ekaniyere Oko-Odion; Kushagra Bhatheja; Degang Chen 001 (MWSCAS, 2023)

Very Compact Temperature Sensor for Power/Thermal Management. - Bryce Gadogbe; Ruohang Yang; Kwabena Oppong Banahene; Pallavi Ebenezer; Randall L. Geiger; Degang Chen 001 (MWSCAS, 2023)

Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm. - Michael Sekyere; Emmanuel Nti Darko; Isaac Bruce; Ekaniyere Oko-Odion; Kushagra Bhatheja; Degang Chen 001 (MWSCAS, 2023)

A Compact and Accurate MOS-based Temperature Sensor for Thermal Management. - Ruohan Yang; Bryce Gadogbe; Randall L. Geiger; Degang Chen 001 (MWSCAS, 2023)

A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. - Isaac Bruce; Praise O. Farayola; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (J. Electron. Test., 2023)

Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction. - Praise O. Farayola; Ekaniyere Oko-Odion; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (IEEE Des. Test, 2023)

A 3-Segment Interpolating String DAC with Low-Cost Built-In-Self-Test Capabilities. - Isaac Bruce; Emmanuel Nti Darko; Ekaniyere Oko-Odion; Kushagra Bhatheja; Matthew Crabb; Degang Chen 001 (ISVLSI, 2024)

Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm. - Ekaniyere Oko-Odion; Isaac Bruce; Emmanuel Nti Darko; Michael Sekyere; Degang Chen 001 (ISVLSI, 2024)

A Robust On-Chip Sensor for Online Monitoring of BTI-Induced Aging in Integrated Circuits. - Daniel Adjei; Emmanuel Nti Darko; Degang Chen 001 (ITC, 2024)

Novel Single-Temperature Trim Techniques for Bandgap Voltage References. - Daniel Adjei; Bryce Gadogbe; Degang Chen 001; Randall L. Geiger (MWSCAS, 2024)

Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm. - Isaac Bruce; Emmanuel Nti Darko; Ekaniyere Oko-Odion; Matthew Crabb; Degang Chen 001 (MWSCAS, 2024)

A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs. - Saeid Karimpour; Isaac Bruce; Michael Sekyere; Ruohan Yang; Emmanuel Nti Darko; Degang Chen 001 (MWSCAS, 2024)

Invited Paper: Low Power, Fully-Integrated Flipped Voltage Follower LDO Using Off-State Non-Linear Circuits for Enhanced Transient Performance. - Michael Sekyere; Degang Chen 001 (MWSCAS, 2024)

A BIST Approach to Approximate Co-Testing of Embedded Data Converters. - Kushagra Bhatheja; Shravan K. Chaganti; Johnathan Leisinger; Emmanuel Nti Darko; Isaac Bruce; Degang Chen 001 (IEEE Des. Test, 2024)

Efficient Hybrid Resistor-String and Capacitor DAC with Area Efficient Redundancy-Based Digital Calibration for High-Performance Applications. - Ekaniyere Oko-Odion; Emmanuel Nti Darko; Isaac Bruce; Matthew Crabb; Degang Chen 001 (I2MTC, 2025)

Digital Defect Oriented Test Method for Phase Locked Loops with High Coverage. - Michael Sekyere; Marampally Saikiran; Godfred Bonsu; Kelvin W. Tamakloe; Rob Butler; Reed Adams; Degang Chen 001 (I2MTC, 2025)

A Compact 3-Segment 15-bit Capacitive DAC with Digital Calibration for Improved Linearity. - Emmanuel Nti Darko; Isaac Bruce; Ekaniyere Oko-Odion; Saeid Karimpour; Kushagra Bhatheja; Degang Chen 001 (ISCAS, 2025)

Signal Flow Graph Analysis of Analog Circuits using Principles of Control Theory : Tutorial Review. - Michael Sekyere; Marampally Saikiran; Degang Chen 001 (ISCAS, 2025)

Robust Defect Detection for Phase-Locked Loops using All-Digital Built-In Self-Test (BIST) Circuitry. - Michael Sekyere; Marampally Saikiran; Rob Butler; Reed Adams; Degang Chen 001 (ISCAS, 2025)

High-Accuracy, Cost-Effective Built-In Self-Test Approach for High-Resolution Data Converters. - Emmanuel Nti Darko; Saeid Karimpour; Degang Chen 001 (VTS, 2025)

A 32 μm2 MOS-Based Remote Sensing Temperature Sensor with 1.29 °C Inaccuracy for Thermal Management. - Ruohan Yang; Kwabena Oppong Banahene; Bryce Gadogbe; Randall L. Geiger; Degang Chen 001 (Comput., 2025)

Matching Critical Analog Circuit Components Up To Third-Order Gradients for All Possible Exact Matching Ratios. - Michael Sekyere; Isaac Bruce; Ruohan Yang; Degang Chen 001; Colin C. McAndrew; Xiankun Jin; Chen He; Doug Garrity (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)