Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology. - Xiaoyang Du; Shurong Dong; Yan Han; Juin J. Liou; Mingxu Huo; You Li; Qiang Cui; Dahai Huang; Demiao Wang (Microelectron. Reliab., 2008)

Reliability enhancement of zinc oxide varistors using sputtered silver electrodes. - Hao Jin; Xiao Xu; Yebo Tao; Bin Feng; Demiao Wang (Microelectron. Reliab., 2016)