Intelligent Methods for Test and Reliability. - Hussam Amrouch; Jens Anders; Steffen Becker 001; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; et al. (DATE, 2022)

A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors. - Jens Anders; Pablo Andreu; Bernd Becker 001; Steffen Becker 001; Riccardo Cantoro; Nikolaos Ioannis Deligiannis; Nourhan Elhamawy; Tobias Faller; Carles Hernández 001; Nele Mentens; Mahnaz Namazi Rizi; Ilia Polian; et al. (ETS, 2023)

Automating Greybox System-Level Test Generation. - Denis Schwachhofer; Maik Betka; Steffen Becker 001; Stefan Wagner 001; Matthias Sauer 002; Ilia Polian (ETS, 2023)

Large Language Model-Based Optimization for System-Level Test Program Generation. - Denis Schwachhofer; Peter Domanski; Steffen Becker 001; Stefan Wagner 001; Matthias Sauer 002; Dirk Pflüger; Ilia Polian (DFT, 2024)

Optimizing System-Level Test Program Generation via Genetic Programming. - Denis Schwachhofer; Francesco Angione; Steffen Becker 001; Stefan Wagner 001; Matthias Sauer 002; Paolo Bernardi; Ilia Polian (ETS, 2024)

Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties. - Denis Schwachhofer; Peter Domanski; Steffen Becker 001; Stefan Wagner 001; Matthias Sauer 002; Dirk Pflüger; Ilia Polian (ETS, 2024)

Large Language Models to Generate System-Level Test Programs Targeting Non-functional Properties. - Denis Schwachhofer; Peter Domanski; Steffen Becker 001; Stefan Wagner 001; Matthias Sauer 002; Dirk Pflüger; Ilia Polian (CoRR, 2024)