Impact of process variability on BEOL TDDB lifetime model assessment. - Kris Croes; Deniz Kocaay; Ivan Ciofi; Jürgen Bömmels; Zsolt Tökei (IRPS, 2015)

LER and spacing variability on BEOL TDDB using E-field mapping: Impact of field acceleration. - Deniz Kocaay; Philippe Roussel; Kris Croes; Ivan Ciofi; Yves Saad; Ingrid De Wolf (Microelectron. Reliab., 2017)

Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing. - Deniz Kocaay; Philippe Roussel; Kristof Croes; Ivan Ciofi; Alicja Lesniewska; Ingrid De Wolf (IRPS, 2018)