Degradation testing and failure analysis of DC film capacitors under high humidity conditions. - Huai Wang; Dennis A. Nielsen; Frede Blaabjerg (Microelectron. Reliab., 2015)

Wire bond degradation under thermo- and pure mechanical loading. - Kristian Bonderup Pedersen; Dennis A. Nielsen; Bernhard Czerny; Golta Khatibi; Francesco Iannuzzo; Vladimir N. Popok; Kjeld Pedersen (Microelectron. Reliab., 2017)