Expected current distributions for CMOS circuits. - Dennis J. Ciplickas; Ronald A. Rohrer (ICCAD, 1996)

Processing High Volume Scan Test Results for Yield Learning. - Alfred L. Crouch; Phil Burlison; Dennis J. Ciplickas (ISQED, 2007)

Special session 12B: Panel post-silicon validation & test in huge variance era. - Takahiro J. Yamaguchi; Jacob A. Abraham; Gordon W. Roberts; Suriyaprakash Natarajan; Dennis J. Ciplickas (VTS, 2013)

Yield and Reliability Challenges at 7nm and Below. - Andrzej J. Strojwas; Kelvin Doong; Dennis J. Ciplickas (MIXDES, 2019)