The singularity expansion method and its application to target identification. - Carl E. Baum; Edward J. Rothwell; Kun-Mu Chen; Dennis P. Nyquist (Proc. IEEE, 1991)

Electromagnetic characterization of layered materials via direct and de-embed methods. - Michael J. Havrilla; Dennis P. Nyquist (IEEE Trans. Instrum. Meas., 2006)