Multi-cell soft errors at the 16-nm FinFET technology node. - N. Tam; Bharat L. Bhuva; Lloyd W. Massengill; Dennis R. Ball; Michael W. McCurdy; Michael L. Alles; Indranil Chatterjee (IRPS, 2015)

High-Current State triggered by Operating-Frequency Change. - Lyuan Xu; Jingchen Cao; Shi-Jie Wen; Rita Fung; Jamie Markevitch; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2020)

Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET. - Balaji Narasimham; Vikas Chaudhary; Mike Smith; Liming Tsau; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2021)

Single-Event Latchup Vulnerability at the 7-nm FinFET Node. - Nicholas J. Pieper; Yoni Xiong; Alexandra Feeley; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2022)

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. - Yoni Xiong; Alexandra Feeley; Nicholas J. Pieper; Dennis R. Ball; Balaji Narasimham; John Brockman; N. A. Dodds; S. A. Wender; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2022)

Single-Event Burnout by Cf-252 Irradiation in Vertical $ beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate. - Sajal Islam; Aditha S. Senarath; Arijit Sengupta; En-xia Zhang; Dennis R. Ball; Daniel M. Fleetwood; Ronald D. Schrimpf; Esmat Farzana; Arkka Bhattacharyya; Nolan S. Hendricks; James S. Speck (DRC, 2023)

Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node. - Nicholas J. Pieper; Yoni Xiong; Dennis R. Ball; J. Pasternak; Bharat L. Bhuva (IRPS, 2023)

Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology. - Yoni Xiong; Yueh Chiang; Nicholas J. Pieper; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2023)

Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages. - Jenna B. Kronenberg; Yoni Xiong; Nicholas J. Pieper; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2024)

Scaling Trends and Bias Dependence of SRAM SER from 16-nm to 3-nm FinFET. - Balaji Narasimham; A-R. Montoya; C. Paone; T. Riehle; Mike Smith; Liming Tsau; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2024)

Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node. - Yoni Xiong; Nicholas J. Pieper; Jenna B. Kronenberg; Dennis R. Ball; Megan Casey; Bharat L. Bhuva (IRPS, 2024)

Power-Aware Mitigation of Logic Soft Error Rates at the 3-nm Bulk FinFET Node. - Jenna B. Kronenberg; Y. Xiong; Nicholas J. Pieper; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2025)

Power and SER Performance of Flip-Flop Cells with Low-Leakage Options. - Nicholas J. Pieper; Y. Xiong; Jenna B. Kronenberg; R. Fung; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2025)